Global Patent Index - EP 0006939 B1

EP 0006939 B1 19820728 - POSITIVE TYPE RESIST POLYMER COMPOSITION AND METHOD OF MAKING RESIST PATTERNS

Title (en)

POSITIVE TYPE RESIST POLYMER COMPOSITION AND METHOD OF MAKING RESIST PATTERNS

Publication

EP 0006939 B1 19820728 (EN)

Application

EP 78900234 A 19790606

Priority

JP 13333677 A 19771107

Abstract (en)

[origin: JPS5466122A] PURPOSE:To enhance sensitivity, as well as heat resistance, contrast, resolution, etc., by using a specified copolymer for a positive tye resist material for use in ionizing raidation and ultraviolet lithography. CONSTITUTION:As functional monomers participating in cross-linking reaction, 2-20 mole % of methacrylamide and 0.4-20 mole % of methacryloyl chloride are selected and they are copolymerized with 70-97 mole %. This copolymer is dissolved in a solvent and coated on a substrate. Subsequent heating causes dehydrochlorination, imide type cross-linking, formation of 3-dimensional network structure, and insolubilization in solvents. Then, patterns are formed by irradiating ionizing radiation, and the part of patterns are dissolved selectively in a developing solvent.

IPC 1-7

G03C 1/72; G03F 7/02; H01L 21/302

IPC 8 full level

C08F 220/00 (2006.01); C08F 20/52 (2006.01); C08F 220/04 (2006.01); C08F 220/10 (2006.01); G03F 7/039 (2006.01); H01L 21/027 (2006.01)

CPC (source: EP US)

G03F 7/039 (2013.01 - EP US); Y10S 430/143 (2013.01 - EP)

Designated contracting state (EPC)

DE FR GB

DOCDB simple family (publication)

EP 0006939 A1 19800123; EP 0006939 A4 19800521; EP 0006939 B1 19820728; DE 2861975 D1 19820916; JP S5466122 A 19790528; JP S5624254 B2 19810604; US 4273856 A 19810616; WO 7900283 A1 19790531

DOCDB simple family (application)

EP 78900234 A 19790606; DE 2861975 T 19781106; JP 13333677 A 19771107; JP 7800021 W 19781106; US 11230979 A 19790702