Global Patent Index - EP 0126729 A4

EP 0126729 A4 19861201 - COMBINATION OF TIME RESOLUTION AND MASS DISPERSIVE TECHNIQUES IN MASS SPECTROMETRY.

Title (en)

COMBINATION OF TIME RESOLUTION AND MASS DISPERSIVE TECHNIQUES IN MASS SPECTROMETRY.

Title (de)

KOMBINATION VON ZEITAUFLÖSUNG UND MASSENDISPERSIONSTECHNIKEN IN MASSENSPEKTROMETRIE.

Title (fr)

COMBINAISON DES TECHNIQUES DE RESOLUTION TEMPORELLE ET DE DISPERSION DE MASSE DANS LA SPECTROMETRIE DE MASSE.

Publication

EP 0126729 A4 19861201 (EN)

Application

EP 83902198 A 19830531

Priority

US 38511482 A 19820604

Abstract (en)

[origin: WO8304187A1] Time-of-flight mass spectrometry techniques are simultaneously combined with path-bending spatial dispersion in magnetic- or electric-sector mass spectrometers to improve the mass resolution. The instrumentation generates data defining relationships between parent ions and daughter ions produced by fragmentation, metastable or induced, data to differentiate stable from metastable ion, and data to improve mass resolution. The subject time-resolved mass spectrometers are combined with chromatography apparatus and serve to obtain multidimensional MS/MS-type data during the relatively short duration of a single chromatographic peak. In exemplary apparatus, ions produced by sample ionization are accelerated and then fragmented to produced daughter ions. The daughter ions, together with any unfragmented (stable parent) ions, are mass analyzed in a magnetic or electric sector (44) including a deflection field. A suitable detector system determines two parameters in addition to ion current for unfragmented ions and daughter ions: (1) deflection field strength required to produce a particular angular or spatial dispersion as a result of ion path bending, and (2) ion time-of-flight. The time resolved mass spectrometry techniques permits the rapid collection of complete MS/MS-type data using a transient recording detection system, various types of specialized scans are readily achieved using a simpler time slice system, such as parent ion scans, daughter ion scans, and neutral lass scans, stable ion scans and "total daughter " ions scans.

IPC 1-7

B01D 59/44

IPC 8 full level

B01D 59/44 (2006.01); H01J 49/02 (2006.01); H01J 49/32 (2006.01); H01J 49/40 (2006.01)

CPC (source: EP US)

B01D 59/44 (2013.01 - EP US); H01J 49/004 (2013.01 - EP US); H01J 49/28 (2013.01 - EP US); H01J 49/40 (2013.01 - EP US)

Citation (search report)

  • [A] US 3576992 A 19710504 - MOORMAN CHARLES J, et al
  • [A] US 4037100 A 19770719 - PURSER KENNETH H
  • [A] JOURNAL OF PHYSICS E; SCIENTIFIC INSTRUMENTS, vol. 7, no. 1, January 1974, pages 10-18, London, GB; J.H. BEYNON et al.: "Ion kinetic energy spectrometry"
  • [AD] NASA REPORT (TM-81224), & DYN. MASS. SPECTROM., vol. 6, 1981, pages 111-119; K.A. LINCOLN: "Data acquisition techniques for exploiting the uniqueness of the time-of-flight mass spectrometer: application to sampling pulsed gas systems"
  • [A] THE REVIEW OF SCIENTIFIC INSTRUMENTS, vol. 37, no. 8, August 1966, pages 1068-1070, New York, US; N.C. FENNER et al.: "Laser used for mass analysis"
  • [A] INTERNATIONAL LABORATORY, July/August 1981, pages 46-57, Fairfield, Connecticut, US; T.R. KEMP: "Recent advances in magnetic sector MS"
  • [A] INTERNATIONAL LABORATORY, vol. 11, no. 6, September 1981, pages 76-82, Fairfield, Connecticut, US; R.A. YOST et al.: "An added dimension for structure elucidation through triple quadrupole MS"

Designated contracting state (EPC)

AT BE CH DE FR GB LI LU NL SE

DOCDB simple family (publication)

WO 8304187 A1 19831208; AU 1773883 A 19831216; AU 565346 B2 19870910; CA 1198834 A 19851231; DK 49584 A 19840203; DK 49584 D0 19840203; EP 0126729 A1 19841205; EP 0126729 A4 19861201; IT 1163455 B 19870408; IT 8321459 A0 19830603; IT 8321459 A1 19841203; US 4472631 A 19840918

DOCDB simple family (application)

US 8300862 W 19830531; AU 1773883 A 19830531; CA 429627 A 19830603; DK 49584 A 19840203; EP 83902198 A 19830531; IT 2145983 A 19830603; US 38511482 A 19820604