Global Patent Index - EP 0171885 A1

EP 0171885 A1 19860219 - Programmable bed-of-nailstest access jigs.

Title (en)

Programmable bed-of-nailstest access jigs.

Title (de)

Prüfstifthalterung mit programmierbarer Prüfstiftkonfiguration.

Title (fr)

Support pour des pointes de test avec une configuration de points programmables.

Publication

EP 0171885 A1 19860219 (EN)

Application

EP 85304081 A 19850610

Priority

GB 8415874 A 19840621

Abstract (en)

Bed-of-nails test access jigs are commonly used to effect the required electrical connections between an electronic circuit constructed on a printed circuit board (PCB) and the automatic (electrical) test equipment (ATE) used to carry out their testing. "Fixed" bed-of-nails jigs have a number of disadvantages that can be overcome by the use of a programmable bed-of-nails jig, but the present-day programmable systems using apertured masks, or secondary pin frames, to set up a particular pin configuration, do not provide a good solution where the pin configuration has to be changed during the testing sequence.The invention suggests a design employing individually-controlled pin control mechanisms such that from a total field of pins individual pins can be programmed to make contact with the PCB. It enables the pin actuating mechanism to fit into the space available by proposing the use of miniature clutch, or valve, mechanisms involving the utilisation of an electro rheological fluid. The inventive bed-of-nails device is thus one in which there are individual pin control mechanisms, functionally separate from the control means of any other pin, that utilise either the valve- or the clutch-forming abilities of an electro rheological fluid.

IPC 1-7

G01R 1/073

IPC 8 full level

G01R 1/073 (2006.01); G01R 31/28 (2006.01)

CPC (source: EP US)

G01R 1/07371 (2013.01 - EP US); G01R 1/07392 (2013.01 - EP US)

Citation (search report)

  • [A] DE 2905175 A1 19800821 - TELEFONBAU & NORMALZEIT GMBH
  • [A] IBM TECHNICAL DISCLOSURE BULLETIN, vol. 14, no. 2, July 1971, page 568, Armonk, New York, US; D.W. ORMOND, Jr.: "High-temperature multicontact probe"

Designated contracting state (EPC)

AT BE CH DE FR IT LI LU NL SE

DOCDB simple family (publication)

GB 2161033 A 19860102; GB 2161033 B 19880525; GB 8415874 D0 19840725; EP 0171885 A1 19860219; JP S61159174 A 19860718; US 4730159 A 19880308

DOCDB simple family (application)

GB 8415874 A 19840621; EP 85304081 A 19850610; JP 13585785 A 19850621; US 74446185 A 19850612