EP 0204291 B1 19911009 - DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS, IN PARTICULAR INTEGRATED CHIPS
Title (en)
DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS, IN PARTICULAR INTEGRATED CHIPS
Publication
Application
Priority
- DE 3520031 A 19850604
- DE 3531119 A 19850830
- DE 3531120 A 19850830
- DE 3531142 A 19850830
- DE 3531143 A 19850830
Abstract (en)
[origin: US4889242A] In a device for testing and sorting electronic components, and more particularly integrated circuit chips, the untested components are arranged in parallel magazine channels, which are arranged on a gradient, of an input magazine. The tested components are collected in an output magazine set up in the same way. The magazines are to be suitable, more particularly, for taking up CC (chip carrier) components. These components have a free rear surface upon which they can slip in the magazine channels arranged on a gradient. The magazines consist of a flat base plate (15), upon which guide rails, which are T-shaped in cross section, are mounted in such a way that they limit the magazine channels at the side and at the top, the guide rails being connected with each other to form a block which, as a whole, is capable of being exchanged. The components are tested in a channel, their connecting contacts being connected up with corresponding test contacts. The contact movement is initiated by the components here, while the test contacts are fixed. For this purpose, the components are displaced into the test channel crosswise to the direction of transportation. A shuttle is arranged between the output magazine and a test unit (6) for the components, containing the test channel. The shuttle sits on a shuttle sliding carriage with which it is possible to move along the individual magazine channels. The shuttle may be adjusted in respect of the shuttle sliding carriage executing just the conveying movement, between a loading position, a transporting position and an unloading position. In order to be able to test the components successively in the test unit, they are isolated by means of an isolating apparatus. This consists of two stopping elements which are arranged one after another with interspacing in the direction of transportation of the components, which are capable of being adjusted transverse to the direction of transportation and which are connected with each other by means of a pendulum mechanism. The latter guarantees that the stopping elements are alternately dipped into or drawn out of an isolating channel.
IPC 1-7
IPC 8 full level
B07C 5/344 (2006.01); G01R 31/28 (2006.01)
CPC (source: EP US)
B07C 5/344 (2013.01 - EP US); G01R 31/2851 (2013.01 - EP US); G01R 31/2893 (2013.01 - EP US)
Citation (examination)
- EP 0162207 A1 19851127 - IBM [US]
- DE 2434603 A1 19760129 - WALDMANN GEB SIRP HILTRAUD
Designated contracting state (EPC)
AT BE CH DE FR GB IT LI LU NL SE
DOCDB simple family (publication)
EP 0204291 A2 19861210; EP 0204291 A3 19880203; EP 0204291 B1 19911009; AT E68114 T1 19911015; DE 3681828 D1 19911114; US 4889242 A 19891226
DOCDB simple family (application)
EP 86107427 A 19860602; AT 86107427 T 19860602; DE 3681828 T 19860602; US 86829086 A 19860528