Global Patent Index - EP 0234112 A1

EP 0234112 A1 19870902 - Six-port reflectometer test arrangement.

Title (en)

Six-port reflectometer test arrangement.

Title (de)

Sechstorreflektometer-Prüfanordnung.

Title (fr)

Dispositif de test utilisant un réflectomètre à six portes.

Publication

EP 0234112 A1 19870902 (EN)

Application

EP 86309749 A 19861215

Priority

  • GB 8601108 A 19860117
  • GB 8609227 A 19860416

Abstract (en)

A test arrangement for testing high frequency electrical devices consists of two 6-port reflectometers (40, 41) which can both be connected to a device under test (2). In order to calibrate the test arrangement, an arbitrary termination generator (46) is connected to each test port whilst its test signal is altered. The generator is able to produce signals representing a reflectivity coefficient of greater than unity, so that it simulates active devices as well as passive ones.

IPC 1-7

G01R 27/06

IPC 8 full level

G01R 27/06 (2006.01)

CPC (source: EP US)

G01R 27/06 (2013.01 - EP US)

Citation (search report)

  • [A] EP 0166524 A1 19860102 - SECR DEFENCE BRIT [GB]
  • [A] US 4521728 A 19850604 - LI SHIHE [CA]
  • [AD] IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-26, no. 12, December 1978, pages 951-957, New York, US; G.F. ENGEN: "Calibrating the six-port reflectometer by means of sliding terminations"
  • [AD] IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-25, no. 12, December 1977, pages 1080-1083, New York, US; G.F. ENGEN: "An improved circuit for implementing the six-port technique of microwave measurements"
  • [A] IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-25, no. 12, December 1977, pages 1075-1079, New York, US; G.F. ENGEN: "The six-port reflectometer: An alternative network analyzer"
  • [Y] CPEM 84 DIGEST, CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, 1984, pages 40-41, Delft, NL; T.A. VALKEAPÄÄ: "Six-port reflectometer for 20-1000 MHz"
  • [Y] ARCHIV FÜR ELEKTRONIK UND UBERTRAGUNGSTECHNIK, vol. 39, no. 5, September/October 1985, pages 332-338, Stuttgart, DE; M.E. BIALKOWSKI et al.: "Calibration of the six-port reflectometer using a minimum number of known loads"
  • [A] IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, vol. MTT-32, no. 12, December 1984, pages 1683-1686, IEEE, New York, US; N.S. CHUNG et al.: "A dual six-port automatic network analyzer and its performance"
  • [A] IEE PROCEEDINGS SECTION A - I, vol. 132, no. 2, part H, April 1985, pages 77-81, Stevenage, Herts, GB; L.D. HILL et al.: "Automatic stepped-frequency six-port reflectometer for WG22"
  • [A] 1979 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, 1979, pages 63-68, New York, US; A. ROSS: "Analysis of six-port measurement systems"

Designated contracting state (EPC)

AT BE CH DE ES FR GR IT LI LU NL SE

DOCDB simple family (publication)

EP 0234112 A1 19870902; EP 0234112 B1 19920304; AT E73236 T1 19920315; DE 3684139 D1 19920409; US 4808912 A 19890228

DOCDB simple family (application)

EP 86309749 A 19861215; AT 86309749 T 19861215; DE 3684139 T 19861215; US 94805586 A 19861231