EP 0246672 B1 19900321 - DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS
Title (en)
DEVICE FOR TESTING AND SORTING ELECTRONIC COMPONENTS
Publication
Application
Priority
DE 3340183 A 19831107
Abstract (en)
[origin: US4694964A] In a device for conveying components contained in an input magazine, particularly integrated chips, to an output magazine (3), which is connected to the input magazine by means of a testing device, individual component receiving portions (34) of the output magazine (3) are provided with storage and indicating devices (52), each of which store and indicate information corresponding to a component testing and measuring class. The components are supplied to the receiving portions (34) of the output magazine (3), on the basis of the data stored in the individual storage and indicating devices (52), so that a component determined by the testing device as belonging to a certain component test and measuring class is conveyed to the receiving portions (34) associated with this class, and in the absence of such a receiving portion is conveyed to a receiving portion which is still free, which is then marked as belonging to the test and measuring class in question.
IPC 1-7
IPC 8 full level
B07C 5/344 (2006.01); B07C 5/36 (2006.01)
CPC (source: EP US)
B07C 5/344 (2013.01 - EP US); B07C 5/36 (2013.01 - EP US)
Designated contracting state (EPC)
AT BE CH DE FR GB IT LI LU NL SE
DOCDB simple family (publication)
EP 0246672 A2 19871125; EP 0246672 A3 19880120; EP 0246672 B1 19900321; AT E36659 T1 19880915; AT E51166 T1 19900415; DE 3340183 A1 19850515; DE 3473573 D1 19880929; DE 3481687 D1 19900426; EP 0144715 A1 19850619; EP 0144715 B1 19880824; US 4694964 A 19870922
DOCDB simple family (application)
EP 87110137 A 19841031; AT 84113097 T 19841031; AT 87110137 T 19841031; DE 3340183 A 19831107; DE 3473573 T 19841031; DE 3481687 T 19841031; EP 84113097 A 19841031; US 91729286 A 19861008