EP 0275140 A2 19880720 - Method and circuit for scanning capacitive loads.
Title (en)
Method and circuit for scanning capacitive loads.
Title (de)
Verfahren und Schaltung zum Abtasten von kapazitiven Belastungen.
Title (fr)
Méthode et dispositif de balayage de charges capacitives.
Publication
Application
Priority
- JP 163987 A 19870109
- JP 5007787 A 19870306
Abstract (en)
A high-speed scanning method uses K(K >/= 3) semiconductor switch elements (101,102,103,104) each having one main electrode responsive to an input signal (Vin), another main electrode, and a control electrode responsive to a control signal (o1,o2,o3,o4) for controlling the transmissive and intransmissive states of said input signal from said one main electrode to said other main electrode. Capacitive loads (201,202,203, 204) are connected to the other main electrode of each of the semiconductor switch elements (101,102,103,104), for shifting one of said K-number of semiconductor switch elements (101,102,103,104) sequentially with a predetermined period from said transmissive state to said intransmissive state or vice versa. An arbitrary number L(K > L >/= 2) of semiconductor switch elements (101,102,103,104) of adjacent scans are rendered transmissive, and the period, for which said L-number of semiconductor switch elements (101,102,103,104) are rendered intransmissive, are included in at least one period, to elongate the period for which the scanning signals fluctuate, thereby using low-frequency semiconductor switches. Also disclosed is a high-speed scanning circuit which carries out this scanning method.
IPC 1-7
IPC 8 full level
G09G 3/30 (2006.01); G09G 3/36 (2006.01); G09G 3/20 (2006.01)
CPC (source: EP KR US)
G09G 3/30 (2013.01 - EP US); G09G 3/36 (2013.01 - KR); G09G 3/3648 (2013.01 - EP US); G09G 3/3688 (2013.01 - EP US); G09G 3/2011 (2013.01 - EP US); G09G 3/3614 (2013.01 - EP US); G09G 2300/08 (2013.01 - EP US); G09G 2310/0275 (2013.01 - EP US); G09G 2310/0297 (2013.01 - EP US)
Designated contracting state (EPC)
DE FR GB
DOCDB simple family (publication)
EP 0275140 A2 19880720; EP 0275140 A3 19890719; EP 0275140 B1 19950719; DE 3854163 D1 19950824; DE 3854163 T2 19960404; KR 880009330 A 19880914; KR 960008100 B1 19960619; US 5021774 A 19910604
DOCDB simple family (application)
EP 88300034 A 19880105; DE 3854163 T 19880105; KR 880000098 A 19880109; US 46382390 A 19900117