EP 0333241 A3 19891004 - INTEGRATED MONOLITHIC CIRCUIT COMPRISING A TEST BUS
Title (en)
INTEGRATED MONOLITHIC CIRCUIT COMPRISING A TEST BUS
Publication
Application
Priority
NL 8800374 A 19880216
Abstract (en)
[origin: EP0333241A2] For the testing of an integrated monolithic circuit (IC) it is proposed to provide the integrated monolithic circuit with a test bus (tb) which extends along a functional part (F1, F2, ...) of the circuit which is partitioned into macro circuits (M1, M2) and which is coupled to the macro circuits, each macro circuit comprising a test interface circuit (T1, T2, ...) which is connected in series with test interface circuits of the other macro circuits; via the test interface circuits, the macro circuits can be coupled to the test bus. As a result, macro circuits can be separately tested and in the case of a hierarchic design of integrated circuits, utilizing previously designed macro circuits and test programs for previously designed macro circuits, test development times can be substantially reduced, this is an increasingly important aspect of increasingly complex circuits.
IPC 1-7
IPC 8 full level
G01R 31/317 (2006.01); G01R 31/28 (2006.01); G01R 31/3185 (2006.01); G11C 29/00 (2006.01); G11C 29/02 (2006.01); G11C 29/56 (2006.01); H01L 21/66 (2006.01); H01L 21/822 (2006.01); H01L 27/04 (2006.01); G06F 11/273 (2006.01)
CPC (source: EP KR US)
G01R 31/318536 (2013.01 - EP US); G01R 31/318558 (2013.01 - EP US); H01L 22/00 (2013.01 - KR); G06F 11/2736 (2013.01 - EP US)
Citation (search report)
- [Y] GB 2085171 A 19820421 - CONTROL DATA CORP
- [X] IEEE 7th DIGITAL ANIONICS SYSTEM CONFERENCE, 13th-16th October 1986, pages 410-416, IEEE, New York, US; H.F. BINNENDYK et al.: "Enhancing the testability of a digital design with a testability bus"
- [A] IEEE INTERNATIONAL AUTOMATIC TESTING CONFERENCE, San Francisco, 3rd-5th November 1987, pages 113-117, IEEE, New York, US; J.L. TURINO: "A proposed standard testability bus"
- [A] PROCEEDINGS OF THE IEEE, vol. 71, no. 1, January 1983, pages 98-112, IEEE, New York, US; T.W. WILLIAMS et al.: "Design for testability - A suvey"
Designated contracting state (EPC)
DE FR GB IT NL
DOCDB simple family (publication)
EP 0333241 A2 19890920; EP 0333241 A3 19891004; EP 0333241 B1 19930929; DE 68909452 D1 19931104; DE 68909452 T2 19940407; JP H0210179 A 19900112; KR 0135982 B1 19980429; KR 890013740 A 19890925; NL 8800374 A 19890918; US 4918379 A 19900417
DOCDB simple family (application)
EP 89200312 A 19890210; DE 68909452 T 19890210; JP 3516689 A 19890216; KR 890001675 A 19890214; NL 8800374 A 19880216; US 23909088 A 19880831