Global Patent Index - EP 0420897 B1

EP 0420897 B1 19920415 - METHOD OF PATH AND ANGLE MEASUREMENT

Title (en)

METHOD OF PATH AND ANGLE MEASUREMENT

Publication

EP 0420897 B1 19920415 (DE)

Application

EP 89907065 A 19890622

Priority

DE 3821046 A 19880622

Abstract (en)

[origin: WO8912799A1] A method is proposed for the optronic measurement of path lengths and angles. A first and a second optical beam (13, 14 or 61, 63) are directed, at given angles (a and b), at the surface (12) of the object to be measured so that both beams impinge on the surface at the same point, where diffraction will occur. In one embodiment of the invention, the two beams (13, 14 or 61, 63) have different frequencies. In another embodiment, the frequency of each beam is changed simultaneously and one of the beams is phase-modulated. The phase change in the output signal from the sensor (18) is determined by comparison with a reference signal.

IPC 1-7

G01D 5/38; G01P 3/36

IPC 8 full level

G01B 11/00 (2006.01); G01D 5/38 (2006.01); G01P 3/36 (2006.01)

CPC (source: EP US)

G01D 5/38 (2013.01 - EP US); G01P 3/366 (2013.01 - EP US)

Designated contracting state (EPC)

CH DE FR GB IT LI SE

DOCDB simple family (publication)

WO 8912799 A1 19891228; DE 3821046 A1 19891228; DE 58901197 D1 19920521; EP 0420897 A1 19910410; EP 0420897 B1 19920415; ES 2014165 A6 19900616; JP 2755757 B2 19980525; JP H03505374 A 19911121; US 5141317 A 19920825

DOCDB simple family (application)

DE 8900409 W 19890622; DE 3821046 A 19880622; DE 58901197 T 19890622; EP 89907065 A 19890622; ES 8902194 A 19890622; JP 50694889 A 19890622; US 62392090 A 19901224