Global Patent Index - EP 0475098 B1

EP 0475098 B1 19960207 - X-ray microscope

Title (en)

X-ray microscope

Title (de)

Röntgenmikroskop

Title (fr)

Microscope à rayons X

Publication

EP 0475098 B1 19960207 (DE)

Application

EP 91113635 A 19910814

Priority

DE 4027285 A 19900829

Abstract (en)

[origin: EP0475098A2] The X-ray microscope has a pulsed X-ray source which supplies an intense line radiation such as, for example, a plasma focus source, a reflecting condenser which focuses the radiation of the X-ray source onto the object to be examined, and a X-ray optical system which is constructed as a zone plate and by means of which the object is projected at high resolution onto an X-ray detector. <??>By means of this combination, it is still possible in conjunction with a high resolution free from image defects simultaneously to release at the sample point on the imaging side a satisfactorily high level of X-ray energy, thus producing the short exposure times necessary for the examination of living cells.

IPC 1-7

G21K 7/00

IPC 8 full level

G21K 1/06 (2006.01); G21K 7/00 (2006.01); H04N 5/225 (2006.01); H04N 5/32 (2006.01)

CPC (source: EP US)

G21K 7/00 (2013.01 - EP US)

Designated contracting state (EPC)

AT CH DE FR GB LI NL SE

DOCDB simple family (publication)

EP 0475098 A2 19920318; EP 0475098 A3 19920722; EP 0475098 B1 19960207; AT E134065 T1 19960215; DE 4027285 A1 19920305; DE 59107380 D1 19960321; JP 3133103 B2 20010205; JP H04262300 A 19920917; US 5222113 A 19930622

DOCDB simple family (application)

EP 91113635 A 19910814; AT 91113635 T 19910814; DE 4027285 A 19900829; DE 59107380 T 19910814; JP 21487691 A 19910827; US 75179291 A 19910829