Global Patent Index - EP 0479918 A4

EP 0479918 A4 19930929 - METHOD AND APPARATUS FOR PHOTOINDUCTIVE IMAGING

Title (en)

METHOD AND APPARATUS FOR PHOTOINDUCTIVE IMAGING

Publication

EP 0479918 A4 19930929 (EN)

Application

EP 90911486 A 19900720

Priority

US 51011290 A 19900417

Abstract (en)

[origin: WO9116638A1] A system for photoinductive imaging for flaw detection of materials and for calibrating eddy-current probes includes positioning an eddy-current probe (14) adjacent to a specimen (12) to be analyzed or to be used as a calibration fixture. A source of thermal energy (20) is modulated and focused to a localized area on the specimen. Thermal energy is then scanned across at least a portion of the detection area of the eddy-probe (14). The resulting signal from the eddy-current probe (14) is recorded and can depict either thermal-influenced components of the specimen (12) or the response pattern of the eddy-current probe (14). The record can therefore be used to image flaws or physical holes or shapes of the specimen or calibrate the eddy-current probe (14).

IPC 1-7

G01R 35/00

IPC 8 full level

G01N 25/72 (2006.01); G01N 27/90 (2006.01); G01R 35/00 (2006.01); H04N 5/33 (2006.01)

CPC (source: EP)

B82Y 15/00 (2013.01); G01N 25/72 (2013.01); G01N 27/902 (2013.01); G01R 35/00 (2013.01)

Citation (search report)

  • No further relevant documents disclosed
  • See references of WO 9116638A1

Designated contracting state (EPC)

DE GB

DOCDB simple family (publication)

WO 9116638 A1 19911031; EP 0479918 A1 19920415; EP 0479918 A4 19930929; JP H05500416 A 19930128

DOCDB simple family (application)

US 9004120 W 19900720; EP 90911486 A 19900720; JP 51109090 A 19900720