EP 0573281 B1 20000927 - Method for optimizing a light source profile in an optical exposure apparatus and optical exposure method in which a light source profile is set using such optimization method, in particular where the light is projected obliquely towards a mask
Title (en)
Method for optimizing a light source profile in an optical exposure apparatus and optical exposure method in which a light source profile is set using such optimization method, in particular where the light is projected obliquely towards a mask
Title (de)
Verfahren zur Optimierung eines Lichtquellen-Profils in einem optischen Belichtungsapparat und Verfahren zur optischen Belichtung, in welchem ein Lichtquellen-Profil aus diesem Optimierungsverfahrens verwendet wird, insbesondere indem das Licht schräg auf eine Maske projiziert wird
Title (fr)
Procédé d'optimisation du profil d'une source lumineuse dans un appareil de projection optique et procédé de projection optique basé sur un profil d'une source lumineuse obtenu par ce procédé d'optimisation, notamment par projection oblique de la lumière vers un masque
Publication
Application
Priority
- JP 14154892 A 19920602
- JP 14175592 A 19920602
- JP 18291392 A 19920618
- JP 26741592 A 19921006
- JP 6059393 A 19930319
Abstract (en)
[origin: EP0573281A2] An optical exposure method in photolithography applied for precise processing when semiconductor devices are produced. A pattern on a photomask (307) is projected and exposed on a wafer (309) with an exposure device including an oblique illumination system, a photomask and a projection lens (308). The oblique illumination system is composed of a light source (301), an aperture plate (305) and a condenser lens (303). In one embodiment, the aperture plate has at least opening which is elongated in the direction of elongation of elements of the mask pattern. Alternatively, an array of openings can be orientated according to the direction of elongation of elements of the mask pattern. The illumination can be linearly polarised in the direction of elongation of elements of the mask pattern. The disclosure includes a method for selecting the optimum fly's eye condenser profile.
IPC 1-7
IPC 8 full level
G03F 7/20 (2006.01); G03F 7/207 (2006.01)
CPC (source: EP US)
G03F 7/201 (2013.01 - EP US); G03F 7/70091 (2013.01 - EP US); G03F 7/701 (2013.01 - EP US); G03F 7/70125 (2013.01 - EP US); G03F 7/70241 (2013.01 - EP US); G03F 7/70283 (2013.01 - EP US); G03F 7/70566 (2013.01 - EP US); G03F 7/70583 (2013.01 - EP US)
Designated contracting state (EPC)
FR GB IT
DOCDB simple family (publication)
EP 0573281 A2 19931208; EP 0573281 A3 19940216; EP 0573281 B1 20000927; US 5465220 A 19951107; US 5607821 A 19970304; US 6045976 A 20000404; US 6420094 B1 20020716
DOCDB simple family (application)
EP 93304280 A 19930602; US 50052700 A 20000209; US 51012895 A 19950801; US 6985393 A 19930601; US 73479096 A 19961025