EP 0635882 A3 19951011 - A method of fabricating a silicon carbide vertical mosfet.
Title (en)
A method of fabricating a silicon carbide vertical mosfet.
Title (de)
Verfahren zur Herstellung eines vertikalen MOSFET aus Siliziumkarbid.
Title (fr)
Méthode de fabrication d'un MOSFET vertical dans du carbone de silicium.
Publication
Application
Priority
US 9085893 A 19930712
Abstract (en)
[origin: EP0635882A2] A silicon carbide vertical MOSFET (30, 60) formed on a silicon carbide substrate (35, 65) with portions of epitaxial layers (39, 48 or 69, 78) defining the various transistor electrodes, rather than defining the electrodes with implants and diffusion. An opening (40, 70) is formed in some of the epitaxial layers and a conductive layer (48, 85) is formed therein to electrically connect a drain contact (95) on the rear of the substrate to the components on the front of the substrate. <IMAGE>
IPC 1-7
IPC 8 full level
H01L 21/04 (2006.01); H01L 29/12 (2006.01); H01L 29/24 (2006.01); H01L 29/78 (2006.01)
CPC (source: EP US)
H01L 29/1608 (2013.01 - EP US); H01L 29/66068 (2013.01 - EP US); H01L 29/78 (2013.01 - EP US); H01L 29/7802 (2013.01 - EP US); H01L 29/41766 (2013.01 - EP US); Y10S 148/148 (2013.01 - EP US)
Citation (search report)
- [XA] US 4859621 A 19890822 - EINTHOVEN WILLEM G [US]
- [A] PATENT ABSTRACTS OF JAPAN vol. 017, no. 006 (E - 1302) 7 January 1993 (1993-01-07)
Designated contracting state (EPC)
DE FR GB SE
DOCDB simple family (publication)
EP 0635882 A2 19950125; EP 0635882 A3 19951011; JP H0745831 A 19950214; US 5397717 A 19950314; US 5451797 A 19950919
DOCDB simple family (application)
EP 94109896 A 19940627; JP 17971294 A 19940708; US 37014395 A 19950109; US 9085893 A 19930712