Global Patent Index - EP 0648327 A1

EP 0648327 A1 19950419 - DEVICE FOR THE MEASUREMENT OF THE REFLECTANCE AT A POINT ON A SURFACE.

Title (en)

DEVICE FOR THE MEASUREMENT OF THE REFLECTANCE AT A POINT ON A SURFACE.

Title (de)

ANORDNUNG ZUR PUNKTUELLEN MESSUNG DER REMISSION VON FLÄCHEN.

Title (fr)

SYSTEME PERMETTANT DE MESURER PONCTUELLEMENT LA LUMINANCE DE REFLEXION DE SURFACES.

Publication

EP 0648327 A1 19950419 (DE)

Application

EP 94914419 A 19940426

Priority

  • DE 4314219 A 19930430
  • EP 9401305 W 19940426

Abstract (en)

[origin: WO9425849A1] The invention concerns a device for the measurement of the reflectance of small areas of solid, liquids or gases in several regions of the spectrum (visible, near IR, medium IR), it being possible to determine the surface distribution of the spectral reflectance and/or perceived colour. The invention proposes that special concentrators are disposed behind the individual radiation sources, thus making it possible, without the need for sophisticated design or adjustment measures and with only low radiation losses, to concentrate the radiation on a very small area of the surface under examination.

IPC 1-7

G01N 21/47; G01N 21/25

IPC 8 full level

G01J 3/46 (2006.01); G01N 21/27 (2006.01); G01N 21/47 (2006.01); G02B 6/42 (2006.01)

CPC (source: EP)

G01N 21/474 (2013.01); G02B 6/4298 (2013.01)

Citation (search report)

See references of WO 9425849A1

Designated contracting state (EPC)

DE FR GB IT

DOCDB simple family (publication)

DE 4314219 A1 19941103; EP 0648327 A1 19950419; JP H07508590 A 19950921; WO 9425849 A1 19941110

DOCDB simple family (application)

DE 4314219 A 19930430; EP 9401305 W 19940426; EP 94914419 A 19940426; JP 52386994 A 19940426