Global Patent Index - EP 0673511 A1

EP 0673511 A1 19950927 - METHOD FOR DETERMINING THE CHARACTERISTICS OF AN INSULATOR AND ASSOCIATED ELECTRONIC MICROSCOPE.

Title (en)

METHOD FOR DETERMINING THE CHARACTERISTICS OF AN INSULATOR AND ASSOCIATED ELECTRONIC MICROSCOPE.

Title (de)

VERFAHREN ZUM KENNZEICHNEN EINES ISOLATORS UND ELEKTRONENMIKROSKOP DAFUR.

Title (fr)

PROCEDE DE CARACTERISATION D'UN ISOLANT ET MICROSCOPE ELECTRONIQUE CORRESPONDANT.

Publication

EP 0673511 A1 19950927 (FR)

Application

EP 94930237 A 19941007

Priority

  • FR 9401172 W 19941007
  • FR 9312019 A 19931008

Abstract (en)

[origin: WO9510784A1] Method and device for determining the flashover characteristics of an insulator (5) using an electronic microscope (1) in which the electron flow in the beam (3) is adjusted on the basis of electrons lost, particularly backscattered, secondary or absorbed electrons. A control device (9) responding to certain sensors (10, 12) is provided for the purpose. The electron flow rate is proportional to the voltage simulated in the insulator.

IPC 1-7

G01R 31/12; G01N 27/92

IPC 8 full level

G01N 27/92 (2006.01); G01R 31/12 (2006.01)

CPC (source: EP US)

G01N 27/92 (2013.01 - EP US); G01R 31/12 (2013.01 - EP US); G01R 31/1218 (2013.01 - EP US)

Citation (search report)

See references of WO 9510784A1

Designated contracting state (EPC)

DE DK FR GB IT NL SE

DOCDB simple family (publication)

WO 9510784 A1 19950420; EP 0673511 A1 19950927; FI 952662 A0 19950531; FI 952662 A 19950608; FR 2710983 A1 19950414; FR 2710983 B1 19960216; JP H08504278 A 19960507; US 5635715 A 19970603

DOCDB simple family (application)

FR 9401172 W 19941007; EP 94930237 A 19941007; FI 952662 A 19950531; FR 9312019 A 19931008; JP 51139195 A 19941007; US 44837696 A 19960618