Global Patent Index - EP 0759174 A1

EP 0759174 A1 19970226 - ADAPTER SYSTEM FOR COMPONENT BOARDS, FOR USE IN A TEST DEVICE

Title (en)

ADAPTER SYSTEM FOR COMPONENT BOARDS, FOR USE IN A TEST DEVICE

Title (de)

ADAPTERSYSTEM FÜR BAUGRUPPEN-PLATINEN, ZU VERWENDEN IN EINER PRÜFEINRICHTUNG

Title (fr)

SYSTEME ADAPTATEUR POUR PLAQUETTES A COMPOSANTS, DESTINE A ETRE UTILISE DANS UN DISPOSITIF D'ESSAI

Publication

EP 0759174 A1 19970226 (DE)

Application

EP 96906726 A 19960301

Priority

  • DE 19507127 A 19950301
  • EP 9600880 W 19960301

Abstract (en)

[origin: DE19507127A1] The invention concerns a test device for component boards (31). The test device in question comprises a plurality of test channels which are contact-connected by spring contact pins (2, 3) to the relevant test sites (32) on the board (31). According to the invention, a grid plate (21) is provided to ensure contact between the spring contact pins and the contacts (29) of the test channels and is provided with contact faces (22) on the face in contact with the spring contact pins; a number n of the said contact faces are connected electrically in parallel with a test channel, and the contact faces (no. 1, no. 2,... no. 21,... no. 41,...) of the test channels (a1, a2,... b1,... c1,...) are intermixed and distributed over the surface of the grid plate.

IPC 1-7

G01R 1/073

IPC 8 full level

G01R 1/06 (2006.01); G01R 1/073 (2006.01); G01R 31/02 (2006.01)

CPC (source: EP US)

G01R 1/07328 (2013.01 - EP US); G01R 1/07378 (2013.01 - EP US)

Citation (search report)

See references of WO 9627136A1

Designated contracting state (EPC)

CH DE FR GB IT LI

DOCDB simple family (publication)

DE 19507127 A1 19960912; AU 5002796 A 19960918; EP 0759174 A1 19970226; JP H09512640 A 19971216; US 6140830 A 20001031; WO 9627136 A1 19960906

DOCDB simple family (application)

DE 19507127 A 19950301; AU 5002796 A 19960301; EP 9600880 W 19960301; EP 96906726 A 19960301; JP 52603496 A 19960301; US 73701497 A 19970206