EP 0775917 A2 19970528 - Superconducting quantum interference device fluxmeter and nondestructive inspection apparatus
Title (en)
Superconducting quantum interference device fluxmeter and nondestructive inspection apparatus
Title (de)
Squidmagnetometer und zerstörungsfreies Prüfgerät
Title (fr)
Magnétomètre à squid et dispositif d'inspection non-destructif
Publication
Application
Priority
JP 30478295 A 19951122
Abstract (en)
An inspection apparatus having a compact configuration is provided in a SQUID flux meter used for nondestructive inspection to make inspection for defects, corrosion, etc. of metal in a nondestructive and non-contact mode. A SQUID 1, comprising two Josephson junctions 3, a washer coil 4, shunt resistors 5, a damping resistor 6, and a feedback modulation coil 8, is formed of a superconducting thin film on a substrate 14. A magnetic field applying coil 9 is formed on the same substrate 14 with a superconducting thin film or a normal conducting metal thin film. The magnetic field applying coil 9, which is wound plural turns around the SQUID 1, applies a dc or ac magnetic field for inspection to a sample. The change in magnetic field produced by a defect in the sample is detected directly by the washer coil 4, by which the position and size of the defect are inspected. Since the magnetic field applying coil is integrated on the same substrate as that on which the SQUID is formed, an increase in the scale of the apparatus can be restrained, providing a simple construction. <IMAGE>
IPC 1-7
IPC 8 full level
G01N 27/90 (2006.01); G01R 33/035 (2006.01)
CPC (source: EP US)
G01R 33/0356 (2013.01 - EP US); Y10S 505/726 (2013.01 - EP US); Y10S 505/727 (2013.01 - EP US); Y10S 505/845 (2013.01 - EP US); Y10S 505/846 (2013.01 - EP US)
Designated contracting state (EPC)
DE GB
DOCDB simple family (publication)
EP 0775917 A2 19970528; EP 0775917 A3 19971008; EP 0775917 B1 20040128; DE 69631411 D1 20040304; DE 69631411 T2 20040715; JP 2909807 B2 19990623; JP H09145810 A 19970606; US 5854492 A 19981229
DOCDB simple family (application)
EP 96116260 A 19961010; DE 69631411 T 19961010; JP 30478295 A 19951122; US 73930796 A 19961029