Global Patent Index - EP 0779645 A3

EP 0779645 A3 19970917 -

Publication

EP 0779645 A3 19970917

Application

EP 96309031 A 19961211

Priority

US 57076495 A 19951212

Abstract (en)

[origin: US6027606A] The invention is embodied by a plasma reactor for processing a workpiece, including a reactor enclosure defining a processing chamber, a semiconductor ceiling window, a base within the chamber for supporting the workpiece during processing thereof, the semiconductor ceiling including a gas inlet system for admitting a plasma precursor gas into the chamber through the ceiling, and apparatus for coupling plasma source power into the chamber.

IPC 1-7

H01J 37/32

IPC 8 full level

C23F 4/00 (2006.01); H01J 37/32 (2006.01); H01L 21/02 (2006.01); H01L 21/302 (2006.01); H01L 21/3065 (2006.01); H05H 1/00 (2006.01); H05H 1/42 (2006.01)

CPC (source: EP KR US)

H01J 37/321 (2013.01 - EP US); H01J 37/3211 (2013.01 - EP US); H01J 37/3222 (2013.01 - EP US); H01J 37/32449 (2013.01 - EP US); H01J 37/32467 (2013.01 - EP US); H01L 21/302 (2013.01 - KR); Y10S 156/914 (2013.01 - EP US)

Citation (search report)

Designated contracting state (EPC)

AT BE CH DE ES FR GB GR IE IT LI NL SE

DOCDB simple family (publication)

US 6027606 A 20000222; EP 0779645 A2 19970618; EP 0779645 A3 19970917; JP H09180897 A 19970711; KR 970052615 A 19970729; US 6193836 B1 20010227

DOCDB simple family (application)

US 10895098 A 19980630; EP 96309031 A 19961211; JP 31219696 A 19961122; KR 19960064103 A 19961211; US 48031300 A 20000110