EP 0786796 B1 20000705 - Methods of using ion trap mass spectrometers
Title (en)
Methods of using ion trap mass spectrometers
Title (de)
Verfahren zum Betrieb von Ionenfallenmassenspektrometern
Title (fr)
Méthodes d'utilisation de spectromètres de masse du type piège à ions
Publication
Application
Priority
- EP 93108670 A 19930528
- US 89099192 A 19920529
Abstract (en)
[origin: EP0852390A1] Improved methods of using an ion trap mass spectrometer, whereby AC voltages supplemental to the AC trapping voltage are used for scanning the trap (10), for conducting chemical ionization experiments, and for conducting MS<sup>n</sup> experiments, are shown. In one embodiment a non-resonant, low-frequency supplemental voltage is applied to the trap (10) causing trapped ions to undergo collision induced dissociation. Multiple generations of ion fragments may be simultaneously formed in this manner, thereby enabling MS<sup>n</sup> experiments. The low-frequency supplemental field has the additional property of causing high mass ions to be ejected from the trap (10) as a function of the magnitude of the supplemental voltage. This property may be used to scan the trap (10), for example, by scanning the magnitude of the supplemental voltage. Likewise, when conducting chemical ionization experiments, this property may be used for eliminating unwanted high mass sample ions, formed during ionization of the reagent gas, from the trap (10).
IPC 1-7
IPC 8 full level
H01J 49/42 (2006.01)
CPC (source: EP)
H01J 49/005 (2013.01); H01J 49/145 (2013.01); H01J 49/424 (2013.01); H01J 49/4265 (2013.01)
Designated contracting state (EPC)
CH DE FR GB IT LI
DOCDB simple family (publication)
EP 0852390 A1 19980708; EP 0852390 B1 20040811; EP 0786796 A1 19970730; EP 0786796 B1 20000705
DOCDB simple family (application)
EP 98103434 A 19930528; EP 97104015 A 19930528