Global Patent Index - EP 0809859 B1

EP 0809859 B1 20010613 - MULTIPLE TIER COLLIMATOR SYSTEM FOR ENHANCED STEP COVERAGE AND UNIFORMITY

Title (en)

MULTIPLE TIER COLLIMATOR SYSTEM FOR ENHANCED STEP COVERAGE AND UNIFORMITY

Title (de)

AUS MEHREREN LAGEN BESTEHENDE KOLLIMATORANORDNUNG FÜR VERBESSERTE HÖHENUNTERSCHIEDBESCHICHTUNG UND GLEICHMÄSSIGKEIT

Title (fr)

SYSTEME DE COLLIMATEUR A PLUSIEURS ETAGES POUR AMELIORER LA COUVERTURE DES RELIEFS ET L'UNIFORMITE

Publication

EP 0809859 B1 20010613 (EN)

Application

EP 96903508 A 19960111

Priority

  • US 9600572 W 19960111
  • US 38236695 A 19950201

Abstract (en)

[origin: WO9624155A1] A collimator system for use in PVD sputtering of semiconductor wafers having multiple tiers provided between a target and wafer substrate. The collimator system prevents target atoms from contacting the wafer at substantially oblique angles, thereby providing good step coverage uniformity over the surface of the wafer. Additionally, the presence of more than one tier prevents localized build-up of target atoms that occurs in conventional single tier collimators, thereby providing good flat coverage uniformity over the surface of the wafer.

IPC 1-7

H01J 37/34

IPC 8 full level

H01J 37/34 (2006.01)

CPC (source: EP US)

H01J 37/34 (2013.01 - EP US); H01J 37/3447 (2013.01 - EP US)

Designated contracting state (EPC)

DE FR GB NL

DOCDB simple family (publication)

WO 9624155 A1 19960808; DE 69613352 D1 20010719; DE 69613352 T2 20020425; EP 0809859 A1 19971203; EP 0809859 B1 20010613; TW 436895 B 20010528; US 5643428 A 19970701

DOCDB simple family (application)

US 9600572 W 19960111; DE 69613352 T 19960111; EP 96903508 A 19960111; TW 85100804 A 19960124; US 38236695 A 19950201