Global Patent Index - EP 0814507 A1

EP 0814507 A1 19971229 - Trench capacitor DRAM cell and method of making the same

Title (en)

Trench capacitor DRAM cell and method of making the same

Title (de)

Grabenkondensator-Speicherzelle und Verfahren zur Herstellung derselben

Title (fr)

Cellule DRAM à condensateur empilé et procédé de fabrication

Publication

EP 0814507 A1 19971229 (EN)

Application

EP 97304339 A 19970620

Priority

US 66754196 A 19960621

Abstract (en)

Method for forming three-dimensional device structures such as a trench capacitor DRAM cell comprising a second device (370) formed over a first device (315) is disclosed. A layer (350,355) having a single crystalline top surface (350) is formed above the first device (315) to provide the base for forming the active area of the second device. <IMAGE>

IPC 1-7

H01L 21/8242; H01L 27/108

IPC 8 full level

H01L 21/822 (2006.01); H01L 21/8242 (2006.01); H01L 27/00 (2006.01); H01L 27/04 (2006.01); H01L 27/108 (2006.01)

CPC (source: EP US)

H10B 12/038 (2023.02 - EP US); H10B 12/373 (2023.02 - EP US)

Citation (search report)

  • [X] EP 0526790 A2 19930210 - IBM [US]
  • [X] US 4728623 A 19880301 - LU NICKY C [US], et al
  • [A] US 5372966 A 19941213 - KOHYAMA YUSUKE [JP]
  • [A] PATENT ABSTRACTS OF JAPAN vol. 17, no. 657 (E - 1470) 6 December 1993 (1993-12-06)
  • [A] PATENT ABSTRACTS OF JAPAN vol. 95, no. 6 31 July 1995 (1995-07-31)
  • [A] PATENT ABSTRACTS OF JAPAN vol. 13, no. 68 (E - 716)<3416> 16 February 1989 (1989-02-16)

Designated contracting state (EPC)

AT BE CH DE LI

DOCDB simple family (publication)

EP 0814507 A1 19971229; CN 1182959 A 19980527; JP H1074907 A 19980317; KR 980002967 A 19980330; US 5792685 A 19980811

DOCDB simple family (application)

EP 97304339 A 19970620; CN 97117881 A 19970621; JP 16576497 A 19970623; KR 19970025986 A 19970620; US 66754196 A 19960621