EP 0839391 A4 19990317 - METHOD AND APPARATUS FOR MONOLITHIC OPTOELECTRONIC INTEGRATED CIRCUIT USING SELECTIVE EPITAXY
Title (en)
METHOD AND APPARATUS FOR MONOLITHIC OPTOELECTRONIC INTEGRATED CIRCUIT USING SELECTIVE EPITAXY
Title (de)
VERFAHREN UND VORRICHTUNG FÜR EINE MONOLITHISCHE OPTOELEKTRONISCHE INTEGRIERTE SCHALTUNG MIT VERWENDUNG EINER SELEKTIVEN EPITAXIE
Title (fr)
TECHNIQUE ET DISPOSITIF CONCERNANT UN CIRCUIT INTEGRE OPTO-ELECTRONIQUE MONOLITHIQUE, FAISANT APPEL A L'EPITAXIE SELECTIVE
Publication
Application
Priority
- US 9610916 W 19960626
- US 50372695 A 19950718
Abstract (en)
[origin: WO9704493A1] A monolithic Optoelectronic Integrated Circuit including a photodiode (4) and a CMOS readout circuit (6) is described in which the diode is formed by compositionally graded InGaAs (28) selectively epitaxially grown between a substrate of Si (16) and an absorption layer of InGaAs (22), the areas of said layers being less than 500 square micron and wherein a readout circuit (6') on said substrate is coupled to said diode.
IPC 1-7
IPC 8 full level
H01L 27/14 (2006.01); H01L 21/20 (2006.01); H01L 21/205 (2006.01); H01L 27/144 (2006.01); H01L 31/10 (2006.01)
CPC (source: EP US)
H01L 27/1446 (2013.01 - EP US)
Citation (search report)
- [AD] FITZGERALD E.A. ET AL.: "Nucleation mechanisms and the elimination of misfit dislocations at mismatched interfaces by reduction in growth area", JOURNAL OF APPLIED PHYSICS., vol. 65, no. 6, 15 March 1989 (1989-03-15), NEW YORK US, pages 2220 - 2237, XP002090249
- See references of WO 9704493A1
Designated contracting state (EPC)
BE DE ES FR GB IT NL
DOCDB simple family (publication)
WO 9704493 A1 19970206; AU 6290896 A 19970218; CA 2225930 A1 19970206; CA 2225930 C 20010327; EP 0839391 A1 19980506; EP 0839391 A4 19990317; JP 2993741 B2 19991227; JP H10511815 A 19981110; US 5621227 A 19970415
DOCDB simple family (application)
US 9610916 W 19960626; AU 6290896 A 19960626; CA 2225930 A 19960626; EP 96921786 A 19960626; JP 50668397 A 19960626; US 50372695 A 19950718