Global Patent Index - EP 0871973 A4

EP 0871973 A4 19981021 -

Publication

EP 0871973 A4 19981021

Application

EP 96904583 A 19960131

Priority

  • US 9601641 W 19960131
  • US 38688495 A 19950210

Abstract (en)

[origin: WO9625024A1] The x-ray source of the present invention comprises a charged particle beam generator (112) and a vacuum enclosure assembly (176). The charges particle beam generator includes only a single electrical connection (803) for providing high voltage to the electron gun. The generated charged particle beam is controlled through a series of dynamic and static focus coils (187, 185) and moved across the inner face of the target (50) by a stepping coil assembly comprising X and Y deflection coils (190) as well as an X step and preferably Y step coils (188). Further, to minimize power usage a control grid pinches off the charged particle beam during the steppimg of the beam.

IPC 1-7

H01J 35/00

IPC 8 full level

H05G 1/00 (2006.01); A61B 6/00 (2006.01); H01J 35/14 (2006.01); H01J 35/30 (2006.01); H05G 1/10 (2006.01); H05G 1/52 (2006.01)

CPC (source: EP US)

H01J 35/153 (2019.05 - EP US); H01J 35/30 (2013.01 - EP); H05G 1/10 (2013.01 - EP)

Citation (search report)

Designated contracting state (EPC)

AT BE CH DE DK ES FR GB GR IE IT LI LU MC NL PT SE

DOCDB simple family (publication)

WO 9625024 A1 19960815; AT E241856 T1 20030615; AU 4865196 A 19960827; DE 69628454 D1 20030703; DE 69628454 T2 20040506; EP 0871973 A2 19981021; EP 0871973 A4 19981021; EP 0871973 B1 20030528; IL 116961 A0 19960514; IL 116961 A 20000229; JP H11504750 A 19990427

DOCDB simple family (application)

US 9601641 W 19960131; AT 96904583 T 19960131; AU 4865196 A 19960131; DE 69628454 T 19960131; EP 96904583 A 19960131; IL 11696196 A 19960130; JP 52439996 A 19960131