Global Patent Index - EP 0944998 A1

EP 0944998 A1 19990929 - METHOD AND APPARATUS FOR REDUCING NOISE IN ELECTRONIC FILM DEVELOPMENT

Title (en)

METHOD AND APPARATUS FOR REDUCING NOISE IN ELECTRONIC FILM DEVELOPMENT

Title (de)

VERFAHREN UND VORRICHTUNG ZUR GERÄUSCHREDUZIERUNG IN ELEKTRONISCHER FILMENTWICKLUNG

Title (fr)

PROCEDE ET APPAREIL DE REDUCTION DU BRUIT LORS DU DEVELOPPEMENT NUMERIQUE D'UN FILM

Publication

EP 0944998 A1 19990929 (EN)

Application

EP 97954098 A 19971204

Priority

  • US 9722849 W 19971204
  • US 3211496 P 19961205
  • US 97903897 A 19971126

Abstract (en)

[origin: WO9825399A1] In electronic film development, a film (101) is scanned, using light, multiple times during development. The light is reflected from an emulsion containing milky undeveloped silver halide embedded with developing grains. The undeveloped halide layer has a finite depth over which photons from a light source scatter backward. This depth is within the range of the coherency length of infrared sources commonly used in electronic film development, causing coherency speckle noise in the scanned image. A prescan made after the emulsion swells, but before the silver grains develop, normalizes subsequent scans, pixel by pixel, to cancel coherency speckle and other defects.

IPC 1-7

H04N 1/38

IPC 8 full level

H04N 1/38 (2006.01); G03B 27/46 (2006.01); G03D 3/00 (2006.01); H04N 1/00 (2006.01); H04N 1/04 (2006.01); H04N 1/40 (2006.01); H04N 1/409 (2006.01)

CPC (source: EP KR US)

H04N 1/00249 (2013.01 - EP US); H04N 1/00795 (2013.01 - EP US); H04N 1/38 (2013.01 - KR); H04N 1/40 (2013.01 - EP US); H04N 2201/0404 (2013.01 - EP US); H04N 2201/0416 (2013.01 - EP US)

Designated contracting state (EPC)

CH DE FR GB LI SE

DOCDB simple family (publication)

WO 9825399 A1 19980611; AU 5796698 A 19980629; CN 1231098 A 19991006; EP 0944998 A1 19990929; EP 0944998 A4 20010404; JP 2001503163 A 20010306; KR 100317824 B1 20011222; KR 20000044037 A 20000715; US 6069714 A 20000530; US 6503002 B1 20030107

DOCDB simple family (application)

US 9722849 W 19971204; AU 5796698 A 19971204; CN 97197993 A 19971204; EP 97954098 A 19971204; JP 52589798 A 19971204; KR 19997002001 A 19990310; US 48796700 A 20000118; US 97903897 A 19971126