Global Patent Index - EP 0958656 A1

EP 0958656 A1 19991124 - ARRANGEMENT AND METHOD FOR MEASURING A TEMPERATURE

Title (en)

ARRANGEMENT AND METHOD FOR MEASURING A TEMPERATURE

Title (de)

ANORDNUNG UND VERFAHREN ZUM MESSEN EINER TEMPERATUR

Title (fr)

PROCEDE ET SYSTEME POUR MESURER UNE TEMPERATURE

Publication

EP 0958656 A1 19991124 (DE)

Application

EP 98908009 A 19980129

Priority

  • DE 19704861 A 19970210
  • EP 9800469 W 19980129

Abstract (en)

[origin: WO9835440A1] The invention relates to an arrangement and method for measuring the temperature of a component, in particular of a contactless switch, whereby a transistor or diode is used as a temperature sensor.

IPC 1-7

H03K 17/08

IPC 8 full level

G01K 7/01 (2006.01); H01L 23/34 (2006.01); H03K 17/08 (2006.01); H03K 17/082 (2006.01); H02H 5/04 (2006.01)

CPC (source: EP US)

G01K 7/01 (2013.01 - EP US); H01L 23/34 (2013.01 - EP US); H03K 17/0822 (2013.01 - EP US); H01L 2924/0002 (2013.01 - EP US); H02H 5/044 (2013.01 - EP US); H03K 2017/0806 (2013.01 - EP US)

Citation (search report)

See references of WO 9835440A1

Designated contracting state (EPC)

DE ES FR GB IT SE

DOCDB simple family (publication)

WO 9835440 A1 19980813; DE 19745040 A1 19980820; DE 19745040 C2 20030327; EP 0958656 A1 19991124; JP 2000513816 A 20001017; US 6504697 B1 20030107; WO 9835441 A1 19980813

DOCDB simple family (application)

EP 9800469 W 19980129; DE 19745040 A 19970210; EP 9800357 W 19980123; EP 98908009 A 19980129; JP 53371698 A 19980129; US 36710499 A 19991208