EP 0969289 A1 20000105 - TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT
Title (en)
TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT
Title (de)
PRÜFEN DER FUNKTIONELLEN BLÖCKE IN EINER INTEGRIERTEN HALBLEITERSCHALTUNG
Title (fr)
TEST DES BLOCS FONCTIONNELS DANS UN CIRCUIT INTEGRE A SEMI-CONDUCTEUR
Publication
Application
Priority
- JP 9801249 W 19980320
- JP 6766797 A 19970321
Abstract (en)
A semiconductor integrated circuit (1) includes first, second and second functional blocks (10, 20 and 30). The first, second and second functional blocks (10, 20 and 30) are coupled together via an inter-block signal line (2). The first functional block (10) includes: a logic circuit (11); a test data output circuit (12), which operates during testing and outputs a predetermined test data pattern; a testing standby circuit (14), which is connected between a selector (13) and an external bidirectional pin and makes the functional block enter a standby state during testing; a tristate buffer (15) that is made to have a high impedance by the testing standby circuit (14); and a decision result output circuit (16), which receives the test data pattern from the second functional block, compares the received test data pattern to an expected value stored therein, and outputs a decision result to a decision result signal line (5). <IMAGE>
IPC 1-7
IPC 8 full level
H01L 27/02 (2006.01); G06F 11/22 (2006.01)
CPC (source: EP KR US)
H01L 27/0207 (2013.01 - EP US); H01L 27/04 (2013.01 - KR); G06F 11/2273 (2013.01 - EP US)
Designated contracting state (EPC)
DE FR GB
DOCDB simple family (publication)
EP 0969289 A1 20000105; EP 0969289 A4 20040908; EP 0969289 B1 20061213; DE 69836625 D1 20070125; KR 100522217 B1 20051014; KR 20000076281 A 20001226; TW 366450 B 19990811; US 2004139376 A1 20040715; US 6708301 B1 20040316; WO 9843101 A1 19981001
DOCDB simple family (application)
EP 98909824 A 19980320; DE 69836625 T 19980320; JP 9801249 W 19980320; KR 19997008378 A 19990915; TW 87104273 A 19980320; US 38137799 A 19990920; US 75152504 A 20040106