Global Patent Index - EP 0969289 A1

EP 0969289 A1 2000-01-05 - TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

Title (en)

TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

Title (de)

PRÜFEN DER FUNKTIONELLEN BLÖCKE IN EINER INTEGRIERTEN HALBLEITERSCHALTUNG

Title (fr)

TEST DES BLOCS FONCTIONNELS DANS UN CIRCUIT INTEGRE A SEMI-CONDUCTEUR

Publication

EP 0969289 A1 (EN)

Application

EP 98909824 A

Priority

  • JP 9801249 W
  • JP 6766797 A

Abstract (en)

A semiconductor integrated circuit (1) includes first, second and second functional blocks (10, 20 and 30). The first, second and second functional blocks (10, 20 and 30) are coupled together via an inter-block signal line (2). The first functional block (10) includes: a logic circuit (11); a test data output circuit (12), which operates during testing and outputs a predetermined test data pattern; a testing standby circuit (14), which is connected between a selector (13) and an external bidirectional pin and makes the functional block enter a standby state during testing; a tristate buffer (15) that is made to have a high impedance by the testing standby circuit (14); and a decision result output circuit (16), which receives the test data pattern from the second functional block, compares the received test data pattern to an expected value stored therein, and outputs a decision result to a decision result signal line (5). <IMAGE>

IPC 1-7 (main, further and additional classification)

G01R 31/3185; G01R 31/3187; H01L 21/822; H01L 27/04

IPC 8 full level (invention and additional information)

H01L 27/02 (2006.01); G06F 11/22 (2006.01)

CPC (invention and additional information)

H01L 27/0207 (2013.01); G06F 11/2273 (2013.01)

Designated contracting state (EPC)

DE FR GB

EPO simple patent family

EP 0969289 A1 20000105; EP 0969289 A4 20040908; EP 0969289 B1 20061213; DE 69836625 D1 20070125; TW 366450 B 19990811; US 2004139376 A1 20040715; US 6708301 B1 20040316; WO 9843101 A1 19981001

INPADOC legal status


2010-04-30 [PG25 FR] LAPSED IN A CONTRACTING STATE ANNOUNCED VIA POSTGRANT INFORM. FROM NAT. OFFICE TO EPO

- Ref Country Code: FR

- Free text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

- Effective date: 20091123

2010-04-30 [PG25 GB] LAPSED IN A CONTRACTING STATE ANNOUNCED VIA POSTGRANT INFORM. FROM NAT. OFFICE TO EPO

- Ref Country Code: GB

- Free text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

- Effective date: 20090320

2009-12-25 [REG FR ST] NOTIFICATION OF LAPSE

- Effective date: 20091130

2009-11-25 [GBPC] GB: EUROPEAN PATENT CEASED THROUGH NON-PAYMENT OF RENEWAL FEE

- Effective date: 20090320

2008-07-31 [PGFP FR] POSTGRANT: ANNUAL FEES PAID TO NATIONAL OFFICE

- Ref Country Code: FR

- Payment date: 20080311

- Year of fee payment: 11

2008-05-30 [PGFP GB] POSTGRANT: ANNUAL FEES PAID TO NATIONAL OFFICE

- Ref Country Code: GB

- Payment date: 20080326

- Year of fee payment: 11

2007-11-21 [26N] NO OPPOSITION FILED

- Effective date: 20070914

2007-06-01 [ET] FR: TRANSLATION FILED

2007-03-14 [PG25 DE] LAPSED IN A CONTRACTING STATE ANNOUNCED VIA POSTGRANT INFORM. FROM NAT. OFFICE TO EPO

- Ref Country Code: DE

- Free text: LAPSE BECAUSE OF FAILURE TO SUBMIT A TRANSLATION OF THE DESCRIPTION OR TO PAY THE FEE WITHIN THE PRESCRIBED TIME-LIMIT

- Effective date: 20070314

2007-01-25 [REF] CORRESPONDS TO:

- Document: DE 69836625 P 20070125

2006-12-13 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: B1

- Designated State(s): DE FR GB

2006-12-13 [REG GB FG4D] EUROPEAN PATENT GRANTED

2006-12-06 [RTI1] TITLE (CORRECTION)

- Free text: TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

2006-06-14 [RTI1] TITLE (CORRECTION)

- Free text: TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

2004-11-17 [17Q] FIRST EXAMINATION REPORT

- Effective date: 20041004

2004-09-08 [A4] DESPATCH OF SUPPLEMENTARY SEARCH REPORT

- Effective date: 20040723

2004-09-08 [RIC1] CLASSIFICATION (CORRECTION)

- IPC: 7G 01R 31/3185 A

2004-09-08 [RIC1] CLASSIFICATION (CORRECTION)

- IPC: 7H 01L 21/822 B

2004-09-08 [RIC1] CLASSIFICATION (CORRECTION)

- IPC: 7H 01L 27/04 B

2004-09-08 [RIC1] CLASSIFICATION (CORRECTION)

- IPC: 7G 01R 31/3187 B

2000-01-05 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 19991020

2000-01-05 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: A1

- Designated State(s): DE FR GB