Global Patent Index - EP 0969289 A1

EP 0969289 A1 20000105 - TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

Title (en)

TESTING THE FUNCTIONAL BLOCKS IN A SEMICONDUCTOR INTEGRATED CIRCUIT

Title (de)

PRÜFEN DER FUNKTIONELLEN BLÖCKE IN EINER INTEGRIERTEN HALBLEITERSCHALTUNG

Title (fr)

TEST DES BLOCS FONCTIONNELS DANS UN CIRCUIT INTEGRE A SEMI-CONDUCTEUR

Publication

EP 0969289 A1 (EN)

Application

EP 98909824 A

Priority

  • JP 9801249 W
  • JP 6766797 A

Abstract (en)

A semiconductor integrated circuit (1) includes first, second and second functional blocks (10, 20 and 30). The first, second and second functional blocks (10, 20 and 30) are coupled together via an inter-block signal line (2). The first functional block (10) includes: a logic circuit (11); a test data output circuit (12), which operates during testing and outputs a predetermined test data pattern; a testing standby circuit (14), which is connected between a selector (13) and an external bidirectional pin and makes the functional block enter a standby state during testing; a tristate buffer (15) that is made to have a high impedance by the testing standby circuit (14); and a decision result output circuit (16), which receives the test data pattern from the second functional block, compares the received test data pattern to an expected value stored therein, and outputs a decision result to a decision result signal line (5). <IMAGE>

IPC 1-7

G01R 31/3185; G01R 31/3187; H01L 21/822; H01L 27/04

IPC 8 full level

H01L 27/02 (2006.01); G06F 11/22 (2006.01)

CPC (source: EP)

H01L 27/0207 (2013.01); G06F 11/2273 (2013.01)

Designated contracting state (EPC)

DE FR GB

DOCDB simple family (publication)

EP 0969289 A1 20000105; EP 0969289 A4 20040908; EP 0969289 B1 20061213; DE 69836625 D1 20070125; KR 100522217 B1 20051014; KR 20000076281 A 20001226; TW 366450 B 19990811; US 2004139376 A1 20040715; US 6708301 B1 20040316; WO 9843101 A1 19981001

DOCDB simple family (application)

EP 98909824 A 19980320; DE 69836625 A 19980320; JP 9801249 W 19980320; KR 19997008378 A 19990915; TW 87104273 A 19980320; US 38137799 A 19990920; US 75152504 A 20040106