Global Patent Index - EP 0990163 A4

EP 0990163 A4 20000405 - REUSABLE DIE CARRIER FOR BURN-IN AND BURN-IN PROCESS

Title (en)

REUSABLE DIE CARRIER FOR BURN-IN AND BURN-IN PROCESS

Title (de)

WIEDERVERWENDBARER CHIPTRÄGER ZUM EINBRENNEN SOWIE EINBRENNVERFAHREN

Title (fr)

SUPPORT DE DE REUTILISABLE POUR ESSAI DE VIEILLISSEMENT, ET PROCEDE DE VIEILLISSEMENT

Publication

EP 0990163 A4 20000405 (EN)

Application

EP 97924660 A 19970512

Priority

  • US 9707940 W 19970512
  • US 64534396 A 19960513

Abstract (en)

[origin: WO9743658A1] A reusable carrier (10) for temporarily holding an integrated circuit (12) during burn-in and electrical test includes a base (14) and a lid (16) attached to the base (14) by hinges (18). A flexible substrate (19) is attached to the base (14). Alignment posts (20) have tapered surfaces (22) that engage corners (24) of the integrated circuit (12) to position the integrated circuit (12) precisely on upper surface (26) of the substrate (19). A spring-loaded latch (28) engages projection (30) in aperture (32) of the base (14) to hold the lid (16) closed over the integrated circuit (12). Electrically conductive traces (34) on the surface (26) have contact bumps which engage contact pads on the underside of the integrated circuit (12) to connect the integrated circuit (12) to peripheral contact pads (38) around edges (40) of the substrate (19). A spring (42) engages upper surface (43) of the integrated circuit (12) when the lid (16) is in its closed position over the integrated circuit (12), to provide a biasing force to urge the contact pads against the conductive traces (34).

IPC 1-7

G01R 31/02; G01R 1/04

IPC 8 full level

H01L 21/673 (2006.01); G01R 1/04 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2006.01); H01L 21/66 (2006.01)

CPC (source: EP)

G01R 1/0483 (2013.01)

Citation (search report)

  • [X] WO 9502196 A1 19950119 - AEHR TEST SYSTEMS INC [US] & US 5517125 A 19960514 - POSEDEL RHEA [US], et al
  • [X] US 5397245 A 19950314 - ROEBUCK RANDAL D [US], et al
  • [A] UENO T ET AL: "MEMBRANE PROBE TECHNOLOGY FOR MCM KNOWN-GOOD-DIE", PROCEEDINGS OF THE INTERNATIONAL TEST CONFERENCE,US,NEW YORK, IEEE, 2 October 1994 (1994-10-02), pages 22-29, XP000519960, ISBN: 0-7803-2103-0
  • See references of WO 9743658A1

Designated contracting state (EPC)

BE DE FR GB IE IT NL PT

DOCDB simple family (publication)

WO 9743658 A1 19971120; CN 1107232 C 20030430; CN 1222976 A 19990714; EP 0990163 A1 20000405; EP 0990163 A4 20000405; JP 2000511632 A 20000905; JP 3928979 B2 20070613

DOCDB simple family (application)

US 9707940 W 19970512; CN 97194646 A 19970512; EP 97924660 A 19970512; JP 54098597 A 19970512