Global Patent Index - EP 0998758 A1

EP 0998758 A1 20000510 - DRY-ETCHING OF INDIUM AND TIN OXIDES

Title (en)

DRY-ETCHING OF INDIUM AND TIN OXIDES

Title (de)

TROCKENÄTZEN VON INDIUM UND ZINNOXYDEN

Title (fr)

GRAVURE A SEC D'OXYDES D'INDIUM ET D'ETAIN

Publication

EP 0998758 A1 20000510 (EN)

Application

EP 98931554 A 19980623

Priority

  • US 9813139 W 19980623
  • US 88132397 A 19970625

Abstract (en)

[origin: WO9859379A1] An etch method includes providing a layer made of a material selected from the group consisting of an indium oxide (InO), a tin oxide (SnO), a mixture of indium and tin oxides, a compound of indium and of tin and of oxygen having the general formulation: InxSnyOz where z is substantially greater than zero but less than 100 % and where the sum x+y fills the remainder of the 100 %, and a mixture of the preceding ones of the group members. A reactive gas including hydrogen bromide (HBr) and hydrogen iodide (HI) is supplied to a vicinity of the material layer. Also, an electric field is supplied to react the supplied reactive gas with the material layer so as to form volatile byproducts of reactive gas and the material layer.

IPC 1-7

H01L 31/18; H01L 21/3213

IPC 8 full level

H01L 21/302 (2006.01); H01L 21/3213 (2006.01)

CPC (source: EP KR)

H01L 21/3065 (2013.01 - KR); H01L 21/32136 (2013.01 - EP)

Citation (search report)

See references of WO 9859379A1

Designated contracting state (EPC)

BE DE GB NL

DOCDB simple family (publication)

WO 9859379 A1 19981230; EP 0998758 A1 20000510; JP 2002506572 A 20020226; KR 100489921 B1 20050517; KR 20010020474 A 20010315

DOCDB simple family (application)

US 9813139 W 19980623; EP 98931554 A 19980623; JP 50502599 A 19980623; KR 19997012092 A 19991221