EP 1023741 A1 20000802 - ELECTRON SOURCE WITH MICROTIPS, WITH FOCUSING GRID AND HIGH MICROTIP DENSITY, AND FLAT SCREEN USING SAME
Title (en)
ELECTRON SOURCE WITH MICROTIPS, WITH FOCUSING GRID AND HIGH MICROTIP DENSITY, AND FLAT SCREEN USING SAME
Title (de)
MIKROSPITZEN-ELEKTRONENQUELLE MIT FOKUSSIERUNGSGITTER UND HOHER MIKROSPITZENDICHTE UND FLACHSCHIRM UNTER VERWENDUNG EINER SOLCHEN QUELLE
Title (fr)
SOURCE D'ELECTRONS A MICROPOINTES, A GRILLE DE FOCALISATION ET A DENSITE ELEVEE DE MICROPOINTES, ET ECRAN PLAT UTILISANT UNE TELLE SOURCE
Publication
Application
Priority
- FR 9802197 W 19981013
- FR 9712826 A 19971014
Abstract (en)
[origin: FR2769751A1] The upper focussing layer is set back from the extraction layer with a series of curved formations providing good focussing.
IPC 1-7
IPC 8 full level
H01J 3/18 (2006.01); H01J 1/304 (2006.01); H01J 3/02 (2006.01); H01J 9/02 (2006.01); H01J 9/14 (2006.01); H01J 29/04 (2006.01); H01J 29/62 (2006.01); H01J 31/12 (2006.01)
CPC (source: EP US)
H01J 3/022 (2013.01 - EP US)
Designated contracting state (EPC)
DE GB IT
DOCDB simple family (publication)
FR 2769751 A1 19990416; FR 2769751 B1 19991112; DE 69834928 D1 20060727; DE 69834928 T2 20070201; EP 1023741 A1 20000802; EP 1023741 B1 20060614; JP 2001520437 A 20011030; JP 4220122 B2 20090204; US 6534913 B1 20030318; WO 9919896 A1 19990422
DOCDB simple family (application)
FR 9712826 A 19971014; DE 69834928 T 19981013; EP 98949053 A 19981013; FR 9802197 W 19981013; JP 2000516366 A 19981013; US 50954200 A 20000508