Global Patent Index - EP 1038157 A1

EP 1038157 A1 20000927 - PROCESS FOR THE MEASUREMENT OF THREE DIMENSIONAL (3D) PROFILES BY MEANS OF STRUCTURED LIGHT PROJECTION

Title (en)

PROCESS FOR THE MEASUREMENT OF THREE DIMENSIONAL (3D) PROFILES BY MEANS OF STRUCTURED LIGHT PROJECTION

Title (de)

VERFAHREN ZUR MESSUNG VON DREIDIMENSIONALEN PROFILEN UNTER VERWENDUNG VON STRUKTURIERTER LICHTPROJEKTION

Title (fr)

PROCEDE DE MESURE DE PROFILS EN TROIS DIMENSIONS (3D) PAR PROJECTION D'UNE LUMIERE STRUCTUREE

Publication

EP 1038157 A1 20000927 (EN)

Application

EP 98963529 A 19981130

Priority

  • EP 9807705 W 19981130
  • IT MI972667 A 19971202

Abstract (en)

[origin: WO9928704A1] Process for the measurement of three dimensional (3D) profiles by means of the projection of structured light, based on the measurement of the shift which each direction of projection undergoes due to the height of the object under measurement. The process includes the steps of determining the shift in pixel of the light codings, and/or of making sinusoidal the projected fringes, and/or of adding an automatic calibration procedure and/or of adding an automatic procedure which determines the geometrical and optical set-up of the system, given as input the required measurement constraints, and/or of integrating the measurement method called GCM with the measurement method called SGM.

IPC 1-7

G01B 11/24

IPC 8 full level

G01B 11/25 (2006.01)

CPC (source: EP)

G01B 11/2536 (2013.01); G06T 7/521 (2016.12)

Citation (search report)

See references of WO 9928704A1

Designated contracting state (EPC)

DE ES FR GB NL

DOCDB simple family (publication)

WO 9928704 A1 19990610; AU 1876499 A 19990616; EP 1038157 A1 20000927; IT 1296825 B1 19990802; IT MI972667 A1 19990602

DOCDB simple family (application)

EP 9807705 W 19981130; AU 1876499 A 19981130; EP 98963529 A 19981130; IT MI972667 A 19971202