Global Patent Index - EP 1042944 A1

EP 1042944 A1 2000-10-11 - METHOD AND DEVICE FOR MEASURING, CALIBRATING AND USING LASER TWEEZERS

Title (en)

METHOD AND DEVICE FOR MEASURING, CALIBRATING AND USING LASER TWEEZERS

Title (de)

VERFAHREN UND VORRICHTUNG ZUR VERMESSUNG, KALIBRIERUNG UND VERWENDUNG VON LASER-PINZETTEN

Title (fr)

PROCEDE ET DISPOSITIF POUR MESURER, ETALONNER ET UTILISER DES PINCETTES LASER

Publication

EP 1042944 A1 (DE)

Application

EP 98966384 A

Priority

  • DE 19757785 A
  • EP 9808370 W

Abstract (en)

[origin: DE19757785A1] The invention relates to a method for determining or exerting optically induced forces on at least one particle in the optical focus of an optical cage, comprising the following steps: a) the focus is positioned in a micro electrode arrangement with a three dimensional electric field which has field gradients that form an electrical capture range and is placed at a distance from said capture range, and b) the amplitude of the electrical field, the light output of the light flow that forms the optical cage, and/or the distance separating the capture range from the focus are varied in order to detect which of the varied field properties result in transitional movement of the particle to the capture range or vice versa or to provide an at least temporary arrangement of the particle in the capture range.

IPC 1-7 (main, further and additional classification)

H05H 3/04

IPC 8 full level (invention and additional information)

B81C 99/00 (2010.01); G21K 1/00 (2006.01); H05H 3/04 (2006.01)

CPC (invention and additional information)

H05H 3/04 (2013.01); G21K 1/006 (2013.01)

Citation (search report)

See references of WO 9934653A1

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

EPO simple patent family

DE 19757785 A1 19990715; DE 19757785 B4 20050901; AT 221305 T 20020815; EP 1042944 A1 20001011; EP 1042944 B1 20020724; JP 2002500110 A 20020108; US 6991906 B1 20060131; WO 9934653 A1 19990708

INPADOC legal status


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