Global Patent Index - EP 1042944 B1

EP 1042944 B1 20020724 - METHOD AND DEVICE FOR MEASURING, CALIBRATING AND USING LASER TWEEZERS

Title (en)

METHOD AND DEVICE FOR MEASURING, CALIBRATING AND USING LASER TWEEZERS

Title (de)

VERFAHREN UND VORRICHTUNG ZUR VERMESSUNG, KALIBRIERUNG UND VERWENDUNG VON LASER-PINZETTEN

Title (fr)

PROCEDE ET DISPOSITIF POUR MESURER, ETALONNER ET UTILISER DES PINCETTES LASER

Publication

EP 1042944 B1 20020724 (DE)

Application

EP 98966384 A 19981221

Priority

  • DE 19757785 A 19971228
  • EP 9808370 W 19981221

Abstract (en)

[origin: US6991906B1] To measure or exert optically-induced forces on at least one particle in the focus of an optical cage, the following steps are taken: a) the focus is positioned in a microelectrode arrangement with a three-dimensional electrical field that has a field gradient which forms an electrical capture area, and the focus is at a distance from the capture are and b) the amplitude of the electrical field, the light power of the light beam forming the optical cage, and/or the distance of the capture area from the focus are varied to detect which varied field property moves the particle from the focus to the capture area or vice versa, or at least to temporarily move the particle into the capture area.

IPC 1-7

H05H 3/04

IPC 8 full level

B81C 99/00 (2010.01); G21K 1/00 (2006.01); H05H 3/04 (2006.01)

CPC (source: EP US)

G21K 1/006 (2013.01 - EP US); H05H 3/04 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

DOCDB simple family (publication)

US 6991906 B1 20060131; AT E221305 T1 20020815; DE 19757785 A1 19990715; DE 19757785 B4 20050901; DE 59804934 D1 20020829; EP 1042944 A1 20001011; EP 1042944 B1 20020724; JP 2002500110 A 20020108; WO 9934653 A1 19990708

DOCDB simple family (application)

US 58260900 A 20000906; AT 98966384 T 19981221; DE 19757785 A 19971228; DE 59804934 T 19981221; EP 9808370 W 19981221; EP 98966384 A 19981221; JP 2000527131 A 19981221