Global Patent Index - EP 1044565 A1

EP 1044565 A1 20001018 - IMAGING METHOD AND SYSTEM WITH ELONGATE INSPECTION ZONE

Title (en)

IMAGING METHOD AND SYSTEM WITH ELONGATE INSPECTION ZONE

Title (de)

BILDAUFNAHMEVERFAHREN UND-VORRICHTUNG MIT LÄNGLICHER INSPEKTIONSZONE

Title (fr)

PROCEDE ET SYSTEME D'INSPECTION AVEC ZONE D'INSPECTION ALLONGEE

Publication

EP 1044565 A1 20001018 (EN)

Application

EP 98946058 A 19980911

Priority

  • US 9819054 W 19980911
  • US 94895697 A 19971010

Abstract (en)

[origin: WO9920048A1] An elongate inspection system and method for providing a uniform illumination field to a desired inspection zone for inspection of a desired area of an object to be inspected. The elongate inspection system defines an inspection plane extending between an inspection device and the object to be inspected. A primary illumination for the inspection system is provided both from the left (54) and from the right (54) of the inspection plane and a secondary illumination (62) is provided along and coincident with the inspection plane. The primary (54) and secondary (62) illumination combine to provide a contiguous uniform illumination field (27, 29) to facilitate accurate inspection of the desired feature, characteristic or attribute of the object to be inspected.

IPC 1-7

H04N 7/18

IPC 8 full level

G01N 21/88 (2006.01)

CPC (source: EP)

G01N 21/8901 (2013.01)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

DOCDB simple family (publication)

WO 9920048 A1 19990422; AU 9315498 A 19990503; EP 1044565 A1 20001018; EP 1044565 A4 20010228

DOCDB simple family (application)

US 9819054 W 19980911; AU 9315498 A 19980911; EP 98946058 A 19980911