Global patent index - EP 1053450 A1

EP 1053450 A1 2000-11-22 - DEVICE AND METHOD FOR MEASURING THE THICKNESS OF A STRIP

Title (en)

DEVICE AND METHOD FOR MEASURING THE THICKNESS OF A STRIP

Title (de)

VORRICHTUNG UND VERFAHREN ZUR MESSUNG DER DICKE EINER BAHN

Title (fr)

DISPOSITIF ET PROCEDE POUR MESURER L'EPAISSEUR D'UNE BANDE

Publication

EP 1053450 A1 (DE)

Application

EP 99907278 A

Priority

  • DE 9900187 W
  • DE 19802955 A

Abstract (en)

[origin: DE19802955C1] The thickness measuring device has a number of sensor elements spaced across a support surface (1) across which the sheet or web is moved, with detection of the accleration of the sensor element perpendicular to this surface caused by the edge of the web or sheet, fed to an evaluation device (9) for calculating the web or sheet thickness (D).

IPC 1-7 (main, further and additional classification)

G01B 21/08; B65H 7/12

IPC 8 full level (invention and additional information)

G01B 7/06 (2006.01)

CPC (invention and additional information)

G01B 7/06 (2013.01)

Citation (search report)

See references of WO 9937974A1

Designated contracting state (EPC)

CH DE ES FR GB IT LI NL SE

EPO simple patent family

DE 19802955 C1 19990624; EP 1053450 A1 20001122; WO 9937974 A1 19990729

INPADOC legal status

2000-11-22 [17P] REQUEST FOR EXAMINATION FILED

- Ref Legal Event Code: 17P

- Effective date: 20000610

2000-11-22 [AK] DESIGNATED CONTRACTING STATES:

- Ref Legal Event Code: AK

- Designated State(s): CH DE ES FR GB IT LI NL SE