Global Patent Index - EP 1057007 A1

EP 1057007 A1 20001206 - METHOD AND DEVICE FOR CHECKING AT LEAST ONE QUANTITY RELATIVE TO A MATERIAL

Title (en)

METHOD AND DEVICE FOR CHECKING AT LEAST ONE QUANTITY RELATIVE TO A MATERIAL

Title (de)

VERFAHREN UND EINRICHTUNG ZUR ÜBERPRÜFUNG MINDESTENS EINER GRÖSSE AN EINEM MATERIAL

Title (fr)

PROCEDE ET DISPOSITIF POUR LE CONTROLE D'AU MOINS UNE GRANDEUR RELATIVE A UN MATERIAU

Publication

EP 1057007 A1 20001206 (DE)

Application

EP 99903571 A 19990219

Priority

  • EP 99903571 A 19990219
  • CH 9900079 W 19990219
  • EP 98102943 A 19980220

Abstract (en)

[origin: EP0845668A2] The present invention relates to method for determining the characteristics of interest of a material, wherein said method comprises measuring the light reflected from the surface of said material. To this end, several light beams (S1, S2, ..., Sn) are simultaneously directed towards a same point on the surface (B) and the reflected light (R) is further estimated. The light beams can have identical spectra, partially identical spectra from one beam to the other or even different spectra. The reflected light is estimated in a calculation unit (5) by spectrum analysis, in particular and preferably a factor analysis.

IPC 1-7

G01N 21/47; G01N 21/25

IPC 8 full level

G01N 21/25 (2006.01); G01N 21/27 (2006.01); G01N 21/47 (2006.01)

CPC (source: EP)

G01N 21/255 (2013.01); G01N 21/4738 (2013.01)

Citation (search report)

See references of WO 9942815A1

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

DOCDB simple family (publication)

EP 0845668 A2 19980603; EP 0845668 A3 19980902; AU 2407099 A 19990906; EP 1057007 A1 20001206; JP 2002504680 A 20020212; WO 9942815 A1 19990826

DOCDB simple family (application)

EP 98102943 A 19980220; AU 2407099 A 19990219; CH 9900079 W 19990219; EP 99903571 A 19990219; JP 2000532706 A 19990219