Global Patent Index - EP 1104173 A2

EP 1104173 A2 20010530 - Method and apparatus for implementing integrated cavity effect correction in scanners

Title (en)

Method and apparatus for implementing integrated cavity effect correction in scanners

Title (de)

Verfahren und Vorrichtung zur Korrektion des integrierten Aushöhlungseffekts für Scanner

Title (fr)

Procédé et appareil de correction d'effect de cavité intégré pour scanner

Publication

EP 1104173 A2 20010530 (EN)

Application

EP 00124925 A 20001115

Priority

US 44800999 A 19991123

Abstract (en)

A method (100) and apparatus (10) are provided for determining a weighted average measured reflectance parameter Rm for pixels in an image for use in integrated cavity effect correction of the image. For each pixel of interest Pi,j in the image, an approximate spatial dependent average Ai,j, Bi,j of video values in a region of W pixels by H scan lines surrounding the pixel of interest Pi,j is computed by convolving video values Vi,j of the image in the region with a uniform filter. For each pixel of interest Pi,j a result of the convolving step is used as the reflectance parameter Rm. The apparatus (10) includes a video buffer (12) for storing the pixels of the original scanned image, and first and second stage average buffers (16, 12) for storing the computed approximate spatial dependent averages Ai,j, Bi,j. First and second stage processing circuits (14, 18) respectively generate the first and second stage average values Aij, Bij by convolving the video values of the image in a preselected region with a uniform filter. <IMAGE>

IPC 1-7

H04N 1/40

IPC 8 full level

G06T 1/00 (2006.01); G06T 5/20 (2006.01); H04N 1/407 (2006.01)

CPC (source: EP US)

G06T 5/20 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

EP 1104173 A2 20010530; JP 2001177726 A 20010629; JP 4698015 B2 20110608; US 6631215 B1 20031007

DOCDB simple family (application)

EP 00124925 A 20001115; JP 2000353666 A 20001121; US 44800999 A 19991123