EP 1153266 A1 20011114 - MEASURING DEVICE
Title (en)
MEASURING DEVICE
Title (de)
MESSVORRICHTUNG
Title (fr)
DISPOSITIF DE MESURE
Publication
Application
Priority
- DE 19960880 A 19991217
- EP 0012831 W 20001215
Abstract (en)
[origin: WO0144752A1] The invention relates to a measuring device (1) for detecting the thickness of a layer (20) which is applied to a component (100). The thickness is detected in a touchless and nondestructive manner and irrespective of the material the layer (20) is made of. An electromagnetic radiation source (2) is provided which emits radiation in the infrared area. The radiation source (2) is embodied as a solid body laser and is connected to a sensor unit (8) by means of at least one optical waveguide (4). The layer (20) can be scanned with the infrared radiation using the sensor unit. The heat radiation which is emitted by the layer (20) is detected by means of a detector (5) which can be integrated into the sensor unit (8). The thickness of the layer (20) is detected in an evaluation unit (11) according to the measuring signals. Comparative values are stored in said evaluation unit.
IPC 1-7
IPC 8 full level
G01B 11/06 (2006.01); G01B 21/08 (2006.01)
CPC (source: EP)
G01B 11/0658 (2013.01); G01B 21/085 (2013.01)
Citation (search report)
See references of WO 0144752A1
Designated contracting state (EPC)
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
DOCDB simple family (publication)
WO 0144752 A1 20010621; AU 1864401 A 20010625; DE 19960880 A1 20010621; EP 1153266 A1 20011114
DOCDB simple family (application)
EP 0012831 W 20001215; AU 1864401 A 20001215; DE 19960880 A 19991217; EP 00981382 A 20001215