EP 1161654 A1 20011212 - MULTIPLE LAYER CONFOCAL INTERFERENCE MICROSCOPY USING WAVENUMBER DOMAIN REFLECTOMETRY AND BACKGROUND AMPLITUDE REDUCTION AND COMPENSATION
Title (en)
MULTIPLE LAYER CONFOCAL INTERFERENCE MICROSCOPY USING WAVENUMBER DOMAIN REFLECTOMETRY AND BACKGROUND AMPLITUDE REDUCTION AND COMPENSATION
Title (de)
MEHRSCHICHT-KONFOKALE INTERFERENZMIKROSKOPIE MIT WELLENZAHL-DOMAIN-REFLEKTOMETRIE UND AMPLITUDENREDUKTION UND KOMPENSATION
Title (fr)
MICROSCOPIE CONFOCALE D'INTERFERENCES A COUCHES MULTIPLES BASEE SUR LA REFLECTOMETRIE A DOMAINE DE NOMBRE D'ONDES ET SUR LA REDUCTION ET LA COMPENSATION D'AMPLITUDE D'ARRIERE-PLAN
Publication
Application
Priority
- US 0006914 W 20000316
- US 12505799 P 19990318
Abstract (en)
[origin: WO0055572A1] An in-focus image of an information-bearing region within and/or on a substance is discriminated from an out-of focus image so as to reduce errors in image information of the substance by producing a probe beam and a reference beam from a wideband point source (90a), producing antisymmetric spatial properties in the reference beam (83), converting the probe beam (81b) to a beam focused to a line in the region, producing antisymmetric spatial properties in the in-focus return probe beam.
IPC 1-7
IPC 8 full level
G01B 9/02 (2006.01); G01B 9/04 (2006.01); G01M 11/00 (2006.01); G01N 21/956 (2006.01); G02B 21/00 (2006.01); G02B 21/14 (2006.01); G11B 7/005 (2006.01); G11B 7/0065 (2006.01); G11B 7/135 (2006.01); G11B 7/14 (2012.01)
CPC (source: EP KR)
G01B 9/02 (2013.01 - KR); G01B 9/02027 (2013.01 - EP); G01B 9/02042 (2013.01 - EP); G01B 9/04 (2013.01 - EP); G02B 21/0056 (2013.01 - EP); G02B 21/006 (2013.01 - EP); G02B 21/008 (2013.01 - EP); G11B 7/005 (2013.01 - EP); G11B 7/14 (2013.01 - EP)
Designated contracting state (EPC)
CH DE FR GB LI NL SE
DOCDB simple family (publication)
WO 0055572 A1 20000921; CN 1351705 A 20020529; EP 1161654 A1 20011212; EP 1161654 A4 20060927; JP 2002539494 A 20021119; KR 20010083041 A 20010831; KR 20020034988 A 20020509
DOCDB simple family (application)
US 0006914 W 20000316; CN 00807026 A 20000316; EP 00918006 A 20000316; JP 2000605157 A 20000316; KR 20007013645 A 20001202; KR 20017011704 A 20010914