Global Patent Index - EP 1166362 A1

EP 1166362 A1 20020102 - NOVEL SEMICONDUCTOR DEVICE COMBINING THE ADVANTAGES OF SOLID AND SOI ARCHITECTURES, AND METHOD FOR MAKING SAME

Title (en)

NOVEL SEMICONDUCTOR DEVICE COMBINING THE ADVANTAGES OF SOLID AND SOI ARCHITECTURES, AND METHOD FOR MAKING SAME

Title (de)

NEUES HALBLEITERBAUELEMENT, DAS DIE VORTEILE DER MASSEN- UND SOI-ARCHITEKTUR KOMBINIERT, UND DESSEN HERSTELLUNGSVERFAHREN

Title (fr)

NOUVEAU DISPOSITIF SEMI-CONDUCTEUR COMBINANT LES AVANTAGES DES ARCHITECTURES MASSIVE ET SOI, ET PROCEDE DE FABRICATION

Publication

EP 1166362 A1 20020102 (FR)

Application

EP 00910964 A 20000316

Priority

  • FR 0000641 W 20000316
  • FR 9903470 A 19990319

Abstract (en)

[origin: FR2791178A1] The invention concerns a device comprising a silicon substrate (1) having a top surface coated with a thin gate dielectric layer (4) and wherein are formed source and drain regions (5, 6) defining between them a channel region (1a), a gate (7) on the thin gate dielectric layer (4) above the channel (1a) region. The invention is characterised in that it comprises in the channel region(1a) a continuous or discontinuous insulating cavity (2) defining with the source and drain regions a thin silicon layer (3) 1 to 50 nm thick located above the insulating cavity, said insulating cavity (2) having a length representing at least 70 % of a predetermined minimum channel length. The invention is applicable to MOSFET transistors.

IPC 1-7

H01L 29/10; H01L 21/336

IPC 8 full level

H01L 21/336 (2006.01); H01L 29/06 (2006.01); H01L 29/786 (2006.01)

CPC (source: EP)

H01L 29/0649 (2013.01); H01L 29/66772 (2013.01); H01L 29/78603 (2013.01); H01L 29/78654 (2013.01)

Citation (search report)

See references of WO 0057480A1

Designated contracting state (EPC)

GB IT

DOCDB simple family (publication)

FR 2791178 A1 20000922; FR 2791178 B1 20011116; EP 1166362 A1 20020102; WO 0057480 A1 20000928

DOCDB simple family (application)

FR 9903470 A 19990319; EP 00910964 A 20000316; FR 0000641 W 20000316