EP 1166366 B1 20111130 - DOPING PASTES FOR PRODUCING P, P+ AND N, N+ ZONES IN SEMICONDUCTORS
Title (en)
DOPING PASTES FOR PRODUCING P, P+ AND N, N+ ZONES IN SEMICONDUCTORS
Title (de)
DOTIERPASTEN ZUR ERZEUGUNG VON P, P+ UND N, N+ BEREICHEN IN HALBLEITERN
Title (fr)
PATES DE DOPAGE POUR LA PRODUCTION DE ZONES P, P+ ET N, N+ DANS DES SEMICONDUCTEURS
Publication
Application
Priority
- DE 19910816 A 19990311
- EP 0001694 W 20000229
Abstract (en)
[origin: WO0054341A1] The invention relates to novel doting pastes on the basis of boron, phosphorous or boron-aluminum for producing p, p+ and n, n+ zones in monocrystalline and polycrystalline Si wafers. The invention further relates to the use of corresponding pastes as masking pastes in the production of semiconductors, in power electronics or in photovoltaic applications.
IPC 8 full level
H01L 21/225 (2006.01); H01L 21/033 (2006.01); H01L 21/22 (2006.01); H01L 21/312 (2006.01); H01L 21/316 (2006.01); H01L 31/0288 (2006.01); H01L 31/04 (2006.01); H01L 31/068 (2012.01)
CPC (source: EP KR US)
C09D 183/02 (2013.01 - EP US); H01L 21/2225 (2013.01 - EP US); H01L 21/2255 (2013.01 - EP US); H01L 21/228 (2013.01 - EP US); H01L 21/24 (2013.01 - KR); H01L 31/0288 (2013.01 - EP US); H01L 31/068 (2013.01 - EP US); Y02E 10/546 (2013.01 - EP); Y02E 10/547 (2013.01 - EP US); Y10S 252/95 (2013.01 - EP US); Y10S 438/923 (2013.01 - EP US)
Citation (examination)
- WO 8302200 A1 19830623 - BELGE ETAT [BE]
- US 4891331 A 19900102 - RAPP JAMES E [US]
- US 4104091 A 19780801 - EVANS JR JOHN C, et al
- TAKESHI HATTORI: "CONTAMINATION CONTROL: PROBLEMS AND PROSPECTS", SOLID STATE TECHNOLOGY, PENNWELL CORPORATION, TULSA, OK, US, vol. 33, no. 7, 1 July 1990 (1990-07-01), pages 51 - 58, XP000136379, ISSN: 0038-111X
Designated contracting state (EPC)
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
DOCDB simple family (publication)
WO 0054341 A1 20000914; AT E535943 T1 20111215; AU 3960100 A 20000928; AU 766807 B2 20031023; CA 2367137 A1 20000914; CN 1343376 A 20020403; DE 19910816 A1 20001005; EP 1166366 A1 20020102; EP 1166366 B1 20111130; EP 2276058 A1 20110119; EP 2276058 B1 20160217; IL 145333 A0 20020630; IL 145333 A 20090615; IN 1049KO2001 A 20060317; JP 2002539615 A 20021119; KR 100697439 B1 20070320; KR 20010112313 A 20011220; MX PA01009113 A 20020228; NO 20014384 D0 20010910; NO 20014384 L 20010910; PL 350966 A1 20030224; TW 492081 B 20020621; US 6695903 B1 20040224
DOCDB simple family (application)
EP 0001694 W 20000229; AT 00918752 T 20000229; AU 3960100 A 20000229; CA 2367137 A 20000229; CN 00804875 A 20000229; DE 19910816 A 19990311; EP 00918752 A 20000229; EP 10182228 A 20000229; IL 14533300 A 20000229; IL 14533301 A 20010909; IN 1049KO2001 A 20011008; JP 2000604469 A 20000229; KR 20017011471 A 20010910; MX PA01009113 A 20010910; NO 20014384 A 20010910; PL 35096600 A 20000229; TW 89104087 A 20000307; US 93628501 A 20010912