Global Patent Index - EP 1202052 A3

EP 1202052 A3 20040204 - SQUID microscope

Title (en)

SQUID microscope

Title (de)

Squid-Mikroskop

Title (fr)

Microscope à SQUID

Publication

EP 1202052 A3 20040204 (DE)

Application

EP 01125102 A 20011023

Priority

DE 10053034 A 20001026

Abstract (en)

[origin: EP1202052A2] The device has a SQUID (1), a SQUID holder (6), a specimen holder and a container that is open at the top for accommodating the SQUID holder, the SQUID and the specimen holder. The specimen holder is arranged above the SQUID holder with the SQUID. A cooling medium is arranged in the container. An Independent claims is also included for a method of measuring magnetic properties of a specimen with a SQUID microscope.

IPC 1-7

G01N 27/82; G01R 33/035; G01R 33/038

IPC 8 full level

G01N 27/82 (2006.01); G01Q 30/10 (2010.01); G01Q 30/12 (2010.01); G01Q 30/18 (2010.01); G01Q 60/54 (2010.01); G01R 33/038 (2006.01)

CPC (source: EP US)

B82Y 35/00 (2013.01 - US); G01N 27/82 (2013.01 - EP US); G01Q 30/10 (2013.01 - EP US); G01Q 30/12 (2013.01 - EP US); G01Q 60/54 (2013.01 - EP US); G01R 33/0385 (2013.01 - EP US); B82Y 25/00 (2013.01 - US); Y10S 505/846 (2013.01 - EP US)

Citation (search report)

  • [XY] US 5491411 A 19960213 - WELLSTOOD FREDERICK C [US], et al
  • [Y] US 5894220 A 19990413 - WELLSTOOD FREDERICK CHARLES [US], et al
  • [Y] US 5635836 A 19970603 - KIRTLEY JOHN R [US], et al
  • [A] TANAKA S ET AL: "WINDOWLESS HIGH-TC SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MICROSCOPE", JAPANESE JOURNAL OF APPLIED PHYSICS, PUBLICATION OFFICE JAPANESE JOURNAL OF APPLIED PHYSICS. TOKYO, JP, vol. 38, no. 5A, 1 May 1999 (1999-05-01), pages L505 - L507, XP000890577, ISSN: 0021-4922
  • [A] KIRTLEY ET AL: "VARIABLE SAMPLE TEMPERATURE SCANNING SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MICROSCOPE", APPLIED PHYSICS LETTERS, AMERICAN INSTITUTE OF PHYSICS. NEW YORK, US, vol. 74, no. 26, 28 June 1999 (1999-06-28), pages 4011 - 4013, XP000850641, ISSN: 0003-6951
  • [AD] VU L N ET AL: "DESIGN AND IMPLEMENTATION OF A SCANNING SQUID MICROSCOPE", IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, IEEE INC, NEW YORK, US, vol. 3, no. 1, March 1993 (1993-03-01), pages 1918 - 1921, XP000864155, ISSN: 1051-8223

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

EP 1202052 A2 20020502; EP 1202052 A3 20040204; DE 10053034 A1 20020516; DE 10053034 B4 20050630; US 2002057085 A1 20020516; US 6583619 B2 20030624

DOCDB simple family (application)

EP 01125102 A 20011023; DE 10053034 A 20001026; US 3816601 A 20011025