Global Patent Index - EP 1256003 A2

EP 1256003 A2 2002-11-13 - SEMICONDUCTOR COMPONENT TEST SOCKET

Title (en)

SEMICONDUCTOR COMPONENT TEST SOCKET

Title (de)

TESTSOCKEL FÜR HALBLEITERKOMPONENTE

Title (fr)

PRISE DE VERIFICATION D'UN COMPOSANT SEMI-CONDUCTEUR

Publication

EP 1256003 A2 (EN)

Application

EP 01912731 A

Priority

  • JP 2000034990 A
  • US 0104567 W

Abstract (en)

[origin: WO0161364A2] A semiconductor component test socket may be used to connect semiconductor components to a semiconductor component testing apparatus. The test socket is small, light in weight, and has a lower manufacturing cost than conventional test sockets. The test socket includes an interposing assembly and a frame body that includes a biasing member for moving interposed first and second interposing members, of the interposing assembly, from a standby position to a compact position for releasably connecting a semiconductor component to the semiconductor component test socket.

IPC 1-7 (main, further and additional classification)

G01R 1/00

IPC 8 full level (invention and additional information)

H01R 33/76 (2006.01); G01R 1/04 (2006.01); G01R 31/26 (2006.01)

CPC (invention and additional information)

G01R 1/0483 (2013.01)

Citation (search report)

See references of WO 0161364A3

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

EPO simple patent family

WO 0161364 A2 20010823; WO 0161364 A3 20020307; EP 1256003 A2 20021113; JP 2001228204 A 20010824; JP 4641079 B2 20110302

INPADOC legal status


2005-11-09 [18W] APPLICATION WITHDRAWN

- Effective date: 20050914

2003-01-02 [RIN1] INVENTOR CHANGED BEFORE GRANT

- Inventor name: NAITO, MASAHITO

2003-01-02 [RIN1] INVENTOR CHANGED BEFORE GRANT

- Inventor name: NAGUMO, TAKAYUKI

2002-11-13 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20020801

2002-11-13 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: A2

- Designated State(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

2002-11-13 [AX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT TO:

- Free text: AL;LT;LV;MK;RO;SI