Global Patent Index - EP 1256003 A2

EP 1256003 A2 20021113 - SEMICONDUCTOR COMPONENT TEST SOCKET

Title (en)

SEMICONDUCTOR COMPONENT TEST SOCKET

Title (de)

TESTSOCKEL FÜR HALBLEITERKOMPONENTE

Title (fr)

PRISE DE VERIFICATION D'UN COMPOSANT SEMI-CONDUCTEUR

Publication

EP 1256003 A2 20021113 (EN)

Application

EP 01912731 A 20010213

Priority

  • JP 2000034990 A 20000214
  • US 0104567 W 20010213

Abstract (en)

[origin: WO0161364A2] A semiconductor component test socket may be used to connect semiconductor components to a semiconductor component testing apparatus. The test socket is small, light in weight, and has a lower manufacturing cost than conventional test sockets. The test socket includes an interposing assembly and a frame body that includes a biasing member for moving interposed first and second interposing members, of the interposing assembly, from a standby position to a compact position for releasably connecting a semiconductor component to the semiconductor component test socket.

IPC 1-7

G01R 1/00

IPC 8 full level

H01R 33/76 (2006.01); G01R 1/04 (2006.01); G01R 31/26 (2006.01)

CPC (source: EP KR)

G01R 1/0483 (2013.01 - EP); H01R 33/76 (2013.01 - KR)

Citation (search report)

See references of WO 0161364A2

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 0161364 A2 20010823; WO 0161364 A3 20020307; EP 1256003 A2 20021113; JP 2001228204 A 20010824; JP 4641079 B2 20110302; KR 100689161 B1 20070309; KR 20020077438 A 20021011

DOCDB simple family (application)

US 0104567 W 20010213; EP 01912731 A 20010213; JP 2000034990 A 20000214; KR 20027010466 A 20020813