Global Patent Index - EP 1257783 A1

EP 1257783 A1 20021120 - MICRO INERTIAL MEASUREMENT UNIT

Title (en)

MICRO INERTIAL MEASUREMENT UNIT

Title (de)

MIKRO-TRÄGHEITSMESSEINHEIT

Title (fr)

MICRO-UNITE DE MESURE PAR INERTIE

Publication

EP 1257783 A1 20021120 (EN)

Application

EP 00911582 A 20000112

Priority

US 0000882 W 20000112

Abstract (en)

[origin: WO0151890A1] A micro inertial measurement sensor comprises, metal case (1), first circuit board (2), second circuit board (4), third circuit board (7), control circuit board (9), X-axis angular rate detecting unit (21), first front-end circuit (23), Y-axis angular rate detecting unit (41), second front-end circuit (43), Z-axis angular rate detecting unit (71), third front-end circuit (73), three dither motion control circuits provided on ASIC chip (92), wherein an oscillator is provided for reference pick-off signals on the X-axis angular rate detecting unit (21), the Y-axis angular rate detecting unit (41), the Z-axis angular rate detecting unit (71), the angle signal loop circuit and the dither motion control circuit and three dither motion control processing modules which run in DSP chip (91) are connected on control circuit (9) for the first, second and third circuit boards (2, 4, 7), respectively.

IPC 1-7

G01C 19/00

IPC 8 full level

G01C 21/16 (2006.01)

CPC (source: EP US)

G01C 21/188 (2020.08 - EP US)

Citation (search report)

See references of WO 0151890A1

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

DOCDB simple family (publication)

WO 0151890 A1 20010719; EP 1257783 A1 20021120

DOCDB simple family (application)

US 0000882 W 20000112; EP 00911582 A 20000112