Global Patent Index - EP 1264338 A1

EP 1264338 A1 2002-12-11 - METHOD FOR ADJUSTING AN ELECTRICAL PARAMETER ON AN INTEGRATED ELECTRONIC COMPONENT

Title (en)

METHOD FOR ADJUSTING AN ELECTRICAL PARAMETER ON AN INTEGRATED ELECTRONIC COMPONENT

Title (de)

VERFAHREN ZUR JUSTIERUNG EINES ELEKTRISCHEN PARAMETERS AUF EINER INTEGRIERTEN ELEKTRONISCHEN KOMPONENTE

Title (fr)

PROCEDE D'AJUSTAGE D'UN PARAMETRE ELECTRIQUE SUR UN COMPOSANT ELECTRONIQUE INTEGRE

Publication

EP 1264338 A1 (FR)

Application

EP 01913999 A

Priority

  • FR 0100750 W
  • FR 0003260 A

Abstract (en)

[origin: WO0169671A1] The invention concerns a method for making an integrated electronic component arranged on a substrate wafer comprising at least two metallising steps. The invention is characterised in that the value of an electrical parameter of the component is determined after a metallising step, and one of the following metallising processes is carried out with an adjusting mask selected among n predefined masks to obtain a desired value of the parameter, the selection of the adjusting mask being performed in accordance with the predetermined value of the electrical parameter.

IPC 1-7 (main, further and additional classification)

H01L 21/66; H01L 23/66

IPC 8 full level (invention and additional information)

H01L 21/66 (2006.01); H01L 23/66 (2006.01)

CPC (invention and additional information)

H01L 22/14 (2013.01); H01L 22/20 (2013.01); H01L 23/66 (2013.01); H01L 2924/0002 (2013.01)

Combination set (CPC)

H01L 2924/0002 + H01L 2924/00

Citation (search report)

See references of WO 0169671A1

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

EPO simple patent family

FR 2806529 A1 20010921; FR 2806529 B1 20050304; AU 3939101 A 20010924; EP 1264338 A1 20021211; US 2004023482 A1 20040205; US 7704757 B2 20100427; WO 0169671 A1 20010920

INPADOC legal status


2010-03-24 [18D] APPLICATION DEEMED TO BE WITHDRAWN

- Effective date: 20091001

2009-11-25 [17Q] FIRST EXAMINATION REPORT

- Effective date: 20091021

2002-12-11 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20020927

2002-12-11 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: A1

- Designated State(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

2002-12-11 [AX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT TO:

- Free text: AL;LT;LV;MK;RO;SI