Global Patent Index - EP 1318524 B1

EP 1318524 B1 20090318 - X-ray optical system and method for imaging a source

Title (en)

X-ray optical system and method for imaging a source

Title (de)

Röntgen-optisches System und Verfahren zur Abbildung einer Quelle

Title (fr)

Système optique à rayons X et méthode pour former un image d'une source

Publication

EP 1318524 B1 20090318 (DE)

Application

EP 02026625 A 20021129

Priority

DE 10160472 A 20011208

Abstract (en)

[origin: EP1318524A2] The system has two x-ray reflectors (A,B) for focussing an x-ray source (S) onto a target region. The x-ray reflectors are tilted towards each other, with an offset from 90 degrees so that the combined acceptance region of the x-ray reflectors is matched to the shape of the x-ray source and/or the target region. The offset from 90 degrees is preferably between 30 and 85 degrees. The x-ray reflectors may comprise a multilayer structure. <??>Independent claims are also included for the following: <??>(1) an x-ray diffractometer; and <??>(2) a method of focusing an image source for x-ray or neutron radiation onto a target region.

IPC 8 full level

G21K 1/06 (2006.01)

CPC (source: EP US)

G21K 1/06 (2013.01 - EP US)

Designated contracting state (EPC)

FR GB NL

DOCDB simple family (publication)

EP 1318524 A2 20030611; EP 1318524 A3 20070704; EP 1318524 B1 20090318; DE 10160472 A1 20030626; DE 10160472 B4 20040603; US 2003108153 A1 20030612; US 6925147 B2 20050802

DOCDB simple family (application)

EP 02026625 A 20021129; DE 10160472 A 20011208; US 30291802 A 20021125