Global Patent Index - EP 1319257 A2

EP 1319257 A2 2003-06-18 - MAGNETIC LAYER SYSTEM AND A COMPONENT COMPRISING SUCH A LAYER SYSTEM

Title (en)

MAGNETIC LAYER SYSTEM AND A COMPONENT COMPRISING SUCH A LAYER SYSTEM

Title (de)

MAGNETISCHES SCHICHTSYSTEM SOWIE EIN SOLCHES SCHICHTSYSTEM AUFWEISENDES BAUELEMENT

Title (fr)

SYSTEME MAGNETIQUE STRATIFIE ET COMPOSANT COMPORTANT UN SYSTEME MAGNETIQUE STRATIFIE DE CE TYPE

Publication

EP 1319257 A2 (DE)

Application

EP 01976034 A

Priority

  • DE 0103631 W
  • DE 10046782 A

Abstract (en)

[origin: WO0225749A2] The invention relates to a method for producing a new generation of giant magnetoresistance (GMR) sensors and tunnel magnetoresistance (TMR) sensors. According to the invention, a thin-film fixing layer is produced, for example, from a <i>5d</i> transition metal (W, Rd, Os, Ir, Pt) or from a <i>4d </i>transition metal (Pd, Rh, Ru) having a high magnetocrystalline anisotropy. Said thin-film fixing layer fixes the direction of magnetization of the fixed layer (<i>3d</i> ferromagnetic transition metals). A moment filter can be constructed with which the effectiveness of GMR and TMR sensors can be increased.

IPC 1-7 (main, further and additional classification)

H01L 43/08; H01F 10/32

IPC 8 full level (invention and additional information)

H01F 10/12 (2006.01); H01F 10/32 (2006.01); H01L 21/8246 (2006.01); H01L 27/105 (2006.01); H01L 27/22 (2006.01); H01L 43/08 (2006.01); H01L 43/10 (2006.01)

CPC (invention and additional information)

H01L 27/222 (2013.01); B82Y 10/00 (2013.01); H01L 27/22 (2013.01); H01L 43/10 (2013.01)

Citation (search report)

See references of WO 0225749A3

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

EPO simple patent family

WO 0225749 A2 20020328; WO 0225749 A3 20030103; CA 2435025 A1 20020328; DE 10046782 A1 20020418; DE 10046782 B4 20080508; EP 1319257 A2 20030618; JP 2004509476 A 20040325; US 2004008453 A1 20040115

INPADOC legal status


2006-11-15 [18W] APPLICATION WITHDRAWN

- Effective date: 20060929

2004-02-04 [17Q] FIRST EXAMINATION REPORT

- Effective date: 20031008

2003-06-25 [RIN1] INVENTOR CHANGED BEFORE GRANT

- Inventor name: NIE, XILIANG

2003-06-18 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20030328

2003-06-18 [AK] DESIGNATED CONTRACTING STATES:

- Designated State(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR