Global Patent Index - EP 1320791 A2

EP 1320791 A2 20030625 - METHOD FOR AUTOMATICALLY CORRECTING ERRORS OF OPTICAL CORRELATORS CAUSED BY DEFORMATIONS AND A SELF-CORRECTING JTC OPTICAL CORRELATOR

Title (en)

METHOD FOR AUTOMATICALLY CORRECTING ERRORS OF OPTICAL CORRELATORS CAUSED BY DEFORMATIONS AND A SELF-CORRECTING JTC OPTICAL CORRELATOR

Title (de)

VERFAHREN ZUR AUTOMATISCHEN KORREKTUR VON DURCH VERFORMUNGEN HERVORGERUFENEN FEHLERN OPTISCHER KORRELATOREN UND SELBSTKORRIGIERENDER OPTISCHER KORRELATOR VOM TYP JTC

Title (fr)

PROCEDE DE CORRECTION AUTOMATIQUE D'ERREURS DE CORRELATEURS OPTIQUES PROVOQUEES PAR DES DEFORMATIONS, ET CORRELATEUR OPTIQUE DE TYPE JTC A AUTO-CORRECTION

Publication

EP 1320791 A2 20030625 (DE)

Application

EP 01980173 A 20010914

Priority

  • DE 0103593 W 20010914
  • DE 10047504 A 20000915

Abstract (en)

[origin: WO0223302A2] The invention relates to a method for automatically correcting mechanical deformations of optical correlators and to a self-correcting optical correlator for use in the optical correlation analysis of two digital images, which allows the displacement of the images in relation to one another on the image plane to be determined in realtime. The invention uses the method for automatically correcting the errors of optical correlators, which are caused by deformations of the system and occur during the determination of the plane displacement of two digital images in relation to one another. The method is characterised by a vertical or horizontal reflection of the spectral image, the determination of the plane displacement of the images to be analysed in relation to one another at half the distance between the correlation points, the use of only one part of the pixels of the spectral image for the second transformation step and the superimposition of the images to be analysed with a calibration pattern. A JTC optical correlator is used to implement said method.

IPC 1-7

G06E 1/00

IPC 8 full level

G06E 3/00 (2006.01)

CPC (source: EP)

G06E 3/005 (2013.01)

Citation (search report)

See references of WO 0223302A2

Citation (examination)

  • JANSCHEK K.; TCHERNYKH V.; DYBLENKO S.: "Design concept for a secondary payload Earth observation camera", PROCEEDINGS OF THE SPIE, vol. 3870, 20 September 1999 (1999-09-20), pages 78 - 86, XP007908970, Retrieved from the Internet <URL:http://dx.doi.org/10.1117/12.373166>
  • TCHERNYKH V.; JANSCHEK K.; DYBLENKO S.: "Space application of a self-calibrating optical processor or harsh mechanical environment", PROCEEDINGS OF THE 1ST IFAC CONFERENCE ON MECHATRONIC SYSTEMS (MECHATRONICS'00), vol. 1, 18 September 2000 (2000-09-18), pages 309 - 314, XP008107506

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 0223302 A2 20020321; WO 0223302 A3 20030313; AU 1208202 A 20020326; DE 10047504 A1 20020425; DE 10047504 B4 20050303; EP 1320791 A2 20030625

DOCDB simple family (application)

DE 0103593 W 20010914; AU 1208202 A 20010914; DE 10047504 A 20000915; EP 01980173 A 20010914