Global Patent Index - EP 1321999 A1

EP 1321999 A1 2003-06-25 - Shaped Reflector with spatially separated foci for the illumination of identical areas, and method for determining its surface

Title (en)

Shaped Reflector with spatially separated foci for the illumination of identical areas, and method for determining its surface

Title (de)

Reflektor mit geformter Oberfläche und räumlich getrennten Foki zur Ausleuchtung identischer Gebiete und Verfahren zur Oberflächenermittlung

Title (fr)

Réflecteur à surface formée et à foyers spatialement séparés pour l'illumination de territoires identiques,et méthode pour la détermination de la surface

Publication

EP 1321999 A1 (DE)

Application

EP 03005032 A

Priority

  • DE 19945062 A
  • EP 00118245 A

Abstract (en)

Local adapted shapes on a reflector (1) are designed to give the reflector multiple focal points (10a,10b,110a,110b) separated by spaces. As a result, electromagnetic bundles (5a,5b,50a,50b) of rays emerging from rays (4a,4b,40a,40b) separated by spaces are directed at a common illuminating area (3a,3b), especially for bundles with different frequencies/bands that illuminate the reflector. <??>An Independent claim is also included for a method for determining the shaping of a reflector's surface.

Abstract (de)

Die Erfindung betrifft einen Reflektor mit geformter Oberfläche für elektromagnetische Wellen, wobei eine lokale Formgebung des Reflektors (1) derart ausgelegt wird, daß der Reflektor (1) mehrere, räumlich getrennte Foki (10a, 10b, 110a, 110b) aufweist. Es können dadurch von räumlich getrennten Strahlern (4a, 4b, 40a, 40b) ausgehende elektromagnetische Strahlbündel (5a, 5b, 50a, 50b), insbesondere solche verschiedener Frequenz oder Frequenzbänder, die den Reflektor (1) ausleuchten, auf ein gemeinsames Ausleuchtgebiet (3, 3a, 3b) gerichtet werden. <IMAGE>

IPC 1-7 (main, further and additional classification)

H01Q 15/14; H01Q 15/00; H01Q 19/17; H01Q 19/195; H01Q 25/00

IPC 8 full level (invention and additional information)

H01Q 15/00 (2006.01); H01Q 15/14 (2006.01); H01Q 19/17 (2006.01); H01Q 19/195 (2006.01); H01Q 25/00 (2006.01)

CPC (invention and additional information)

H01Q 25/007 (2013.01); H01Q 15/147 (2013.01); H01Q 19/17 (2013.01); H01Q 19/195 (2013.01)

Citation (search report)

  • [X] EP 0219321 A1 19870422 - BRITISH AEROSPACE [GB]
  • [A] EP 0803932 A1 19971029 - LORAL SPACE SYSTEMS INC [US]
  • [A] US 4482897 A 19841113 - DRAGONE CORRADO [US], et al
  • [A] FR 2674377 A1 19920925 - ALCATEL ESPACE [FR]
  • [A] US 4544928 A 19851001 - AFIFI MOSTAFA S [US], et al
  • [X] PATENT ABSTRACTS OF JAPAN vol. 017, no. 542 (E - 1441) 29 September 1993 (1993-09-29)
  • [A] CHERRETTE A.R., LEE S.-W., ACOSTA R.J.: "A Method for producing a shaped contour radiation pattern using a single shaped Reflector and a single feed", IEEE TRANS. ON ANTENNAS AND PROPAGATION, vol. 37, no. 6, June 1989 (1989-06-01), pages 698 - 706, XP002238531
  • [A] R. JORGENSEN, P. BALLING, W. ENGLISH: "Dual Offset Reflector Multibeam Antenna for International Communications Satellite Applications", IEEE TRANS. ON ANTENNAS AND PROPAGATION, vol. AP-33, no. 12, December 1985 (1985-12-01), pages 1304 - 1312, XP002238827

Designated contracting state (EPC)

DE ES FR GB IT SE

EPO simple patent family

EP 1085598 A2 20010321; EP 1085598 A3 20020731; CA 2317388 A1 20010320; CA 2317388 C 20021224; CN 1289158 A 20010328; DE 19945062 A1 20010412; EP 1321999 A1 20030625; JP 2001127538 A 20010511; JP 5220966 B2 20130626; US 6255997 B1 20010703

INPADOC legal status


2007-03-21 [18R] REFUSED

- Effective date: 20061112

2004-06-09 [RAP1] TRANSFER OF RIGHTS OF AN APPLICATION

- Owner name: EADS ASTRIUM GMBH

2004-03-17 [AKX] PAYMENT OF DESIGNATION FEES

- Designated State(s): DE ES FR GB IT SE

2004-02-04 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20031205

2003-06-25 [AC] DIVISIONAL APPLICATION (ART. 76) OF:

- Document: EP 1085598 P

2003-06-25 [AK] DESIGNATED CONTRACTING STATES:

- Designated State(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

2003-06-25 [AX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT TO:

- Countries: AL LT LV MK RO