Global Patent Index - EP 1323170 B1

EP 1323170 B1 20050803 - X-RAY OPTICAL SYSTEM

Title (en)

X-RAY OPTICAL SYSTEM

Title (de)

RÖNTGENOPTISCHE ANORDNUNG

Title (fr)

DISPOSITIF OPTIQUE A RAYONS X

Publication

EP 1323170 B1 20050803 (DE)

Application

EP 01943167 A 20010518

Priority

  • DE 0102043 W 20010518
  • DE 10028970 A 20000605

Abstract (en)

[origin: US2002159562A1] The invention relates to an X-ray optics arrangement having an X-ray source, one element focussing X-rays and one element reflecting X-rays for the generation of a parallel X-radiation having a small beam cross section of high photon flux density. To solve this problem the X-radiation of the X-ray source is directed with the focussing element upon the convex, parabolic and reflecting surface of the reflecting element, and allowed to be advantageously employed in the X-ray analysis, e.g. with the X-ray diffraction measurement, reflectometry and/or fluoro-chemical analysis.

IPC 1-7

G21K 1/06

IPC 8 full level

G01N 23/20 (2006.01); G01N 23/223 (2006.01); G21K 1/06 (2006.01)

CPC (source: EP US)

G21K 1/06 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 0194987 A2 20011213; WO 0194987 A3 20030403; AT E301328 T1 20050815; DE 10028970 C1 20020124; DE 50106990 D1 20050908; EP 1323170 A2 20030702; EP 1323170 B1 20050803; JP 2003536081 A 20031202; US 2002159562 A1 20021031; US 6724858 B2 20040420

DOCDB simple family (application)

DE 0102043 W 20010518; AT 01943167 T 20010518; DE 10028970 A 20000605; DE 50106990 T 20010518; EP 01943167 A 20010518; JP 2002502480 A 20010518; US 4887302 A 20020313