Global Patent Index - EP 1337960 A2

EP 1337960 A2 20030827 - METHOD AND DEVICE FOR DETERMINING AN ERROR RATE OF BIOMETRIC DEVICES

Title (en)

METHOD AND DEVICE FOR DETERMINING AN ERROR RATE OF BIOMETRIC DEVICES

Title (de)

VERFAHREN UND VORRICHTUNG ZUR ERMITTLUNG EINER FEHLERRATE BIOMETRISCHER EINRICHTUNGEN

Title (fr)

PROCEDE ET DISPOSITIF POUR DETERMINER LE TAUX D'ERREURS DE DISPOSITIFS BIOMETRIQUES

Publication

EP 1337960 A2 20030827 (DE)

Application

EP 01984773 A 20011127

Priority

  • EP 01984773 A 20011127
  • EP 0113848 W 20011127
  • EP 00126077 A 20001129

Abstract (en)

[origin: WO0244999A2] In order to determine the error rate of a biometric device (BER), a number of foreign characteristic sets are stored in a database (DAB), which are compared during a testing process with the characteristic set of the authorized person, and personal error rates (FAR, FRR) are determined for the authorized person based on this comparison.

IPC 1-7

G06K 9/00

IPC 8 full level

A61B 5/117 (2016.01); A61B 5/1171 (2016.01); A61B 5/1172 (2016.01); G06F 21/32 (2013.01); G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/00 (2006.01); G07C 9/00 (2006.01); G10L 15/01 (2013.01); G10L 17/10 (2013.01)

CPC (source: EP US)

G06F 18/2415 (2023.01 - EP US); G06V 40/10 (2022.01 - US); G06V 40/50 (2022.01 - EP US); G07C 9/37 (2020.01 - EP US); G10L 15/01 (2013.01 - EP US); G10L 17/10 (2013.01 - EP US)

Designated contracting state (EPC)

DE FR GB IT

DOCDB simple family (publication)

WO 0244999 A2 20020606; WO 0244999 A3 20020829; AR 031427 A1 20030924; CN 1478247 A 20040225; EP 1337960 A2 20030827; JP 2004515014 A 20040520; US 2004044931 A1 20040304

DOCDB simple family (application)

EP 0113848 W 20011127; AR P010105530 A 20011128; CN 01819624 A 20011127; EP 01984773 A 20011127; JP 2002547090 A 20011127; US 43310503 A 20030529